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全反射高速陽電子回折による最表面構造研究

Total-reflection high-energy positron diffraction study on topmost surface structure

深谷 有喜   

Fukaya, Yuki

Total-reflection high-energy positron diffraction (TRHEPD) is a positron version of reflection high-energy electron diffraction (RHEED). Due to the electrostatic repulsion between the positive charge of the positron and the crystal potential of the material, the penetration depth of the incident positron beam is limited to a few layers of the material surface. In particular, total reflection occurs at low grazing incidence and the penetration depth is less than about 1${AA}$, which corresponds to the thickness of one atomic layer. Therefore, TRHEPD is useful for the structure determination of material surfaces and two-dimensional materials. In this paper, we report recent results of structure determination using TRHEPD (intercalated graphene and graphene quasicrystals), together with the characteristics of the TRHEPD technique.

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