Structural investigation of borosilicate glasses by using XAFS measurement in soft X-ray region, 5 (Joint research)

Nagai, Takayuki  ; Aoyama, Yusuke; Okamoto, Yoshihiro  ; Shibata, Daisuke*; Asakura, Kiyotaka*; Hasegawa, Takehiko*; Sato, Seiichi*; Fukaya, Akane*; Kikuchi, Tetsuya*; Hatakeyama, Kiyoshi*

XAFS measurements in the soft X-ray region are suitable for evaluating the chemical state of the surface layer of a measurement sample because the X-ray transmittance is low. This study measured the K-edges of the glass-forming elements boron (B), oxygen (O), sodium (Na), and silicon (Si), as well as the L-edge of the waste component cerium (Ce), to verify the differences between the coagulated layer and the inside of simulated waste glasses made from raw glass compositions with increased alumina concentration. As a result, from the B K-edge XANES spectra, the proportion of B-O tetracoordinate sp structures (BO) on the surface layer of the coagulated glass samples was higher than that on the cut surface inside the glass samples. On the other hand, the O K-edge XANES spectra showed differences by measuring points for each glass sample, but the trends of those differences varied between the glass samples. The reason is that the molten raw glass with increased alumina concentration has a high viscosity, making it impossible to produce waste glasses with a uniform composition. The Na and Si K-edge spectra showed no differences between the coagulated layer and the inside of glass samples. In addition, the Ce L-edge XANES spectra confirmed that the Ce valence in the coagulated layer of glass samples was more oxidized compared to that in the inside of glass samples.