Combined in situ quick X-ray absorption fine structure and X-ray diffraction systems for ultra-high temperature metal oxides

Tanida, Hajime  ; Kobayashi, Toru ; Yaita, Tsuyoshi; Kobata, Masaaki  ; Fukuda, Tatsuo  ; Ito, Ayumi*; Konashi, Kenji*; Arita, Yuji*

Structural analysis using synchrotron radiation, such as X-ray diffraction (XRD) and X-ray absorption fine structure (XAFS), is an effective means of investigating physical properties of materials at high temperatures in order to experimentally clarify their physical properties. However, accurate temperature measurements above 2800 K are difficult, complicating the assessment of structural changes in materials. This study addresses these issues by employing a newly developed furnace capable of reaching 2800 K and performing in situ rapid XAFS and XRD measurements. These advances will improve our understanding of metal oxides at melting points and provide valuable insights into their behaviour under extreme conditions.