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Excited-state lifetimes in $$^{131}$$In, $$^{131}$$Sn, and $$^{136}$$Te measured with the HiCARI $$gamma$$-ray spectrometer at RIBF at RIKEN

理化学研究所RIビームファクトリー(RIBF)のHiCARIガンマ線分光器を用いて測定した$$^{131}$$In、$$^{131}$$Sn、および$$^{136}$$Teの励起状態寿命

Acosta, J.*; Jungclaus, A.*; Armstrong, M.*; G$'o$rska, M.*; Parry, T.*; Orlandi, R.   ; 他29名*

Acosta, J.*; Jungclaus, A.*; Armstrong, M.*; G$'o$rska, M.*; Parry, T.*; Orlandi, R.; 29 of others*

From 2020 to 2021, as part of the HiCARI project, high-resolution in-beam $$gamma$$-ray spectroscopy experiments were conducted at the Radioactive Isotope Beam Factory. Using a collaboratively constructed array of 12 composite Ge detector systems, excitation state half-lives through Doppler-shifted spectroscopy were measured to investigate various physical phenomena. Specifically, we analyzed the Doppler-shifted line shapes of specific spin transitions and decays in $$^{131}$$In, $$^{131}$$Sn, and $$^{136}$$Te, characterizing the array and establishing reliable analytical methods. The obtained half-lifes were compared with existing experimental results and theoretical calculations.

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分野:Physics, Nuclear

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