A Multi-reflection time-of-flight mass spectrograph for superheavy nuclei

Schury, P.*; Ito, Yuta   ; Wada, Michiharu*

The multi-reflection time-of-flight mass spectrograph has recently become of great utility in the study of superheavy nuclei. The device efficiently uses each ion and its operation is amenable to the inclusion of a decay detector being coupled into the time-of-flight (TOF) ion impact detector. In this way, TOF-decay correlation can be measured to unambiguously differentiate low-yield radioactive ions from stable molecular ions or dark counts. This will eventually allow the technique to be applied to the study of extremely low-yield nuclei such as those of Nh and Mc isotopes.