Profiling of collimated swift ion microbeam using 16 M bit DRAM

Mori, Hidenobu*; Hirao, Toshio; Onoda, Shinobu*; Ito, Hisayoshi; Okada, Sohei; Okamoto, Tsuyoshi*; Koizumi, Yoshiharu*

no abstracts in English

Language	:	English
Journal	:	Radiation Physics and Chemistry
Volume	:	60
Number	:	4-5
Pages	:	p.273 - 276
Publication Year/Month	:	2001/03
Meeting title	:	International Symposium on Prospects for Application of Radiation towards the 21st Century
Held date	:	2000/03
Location (city)	:	Tokyo
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0969-806X(00)00361-3
DOI for research data	:
Keywords	:	DRAM; シングルイベント; 高エネルギーマイクロビーム; コリメート方式
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:12.01 Category:Chemistry, Physical
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Registration No. : B19992037
JAEA Abstracts No. : 47000866
Paper Submission No. : 21505

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