Observation of radiation damage induced by single-ion hits at the heavy ion microbeam system

Kamiya, Tomihiro; Sakai, Takuro; Hirao, Toshio; Oikawa, Masakazu*

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	181
Number	:	1-4
Pages	:	p.280 - 285
Publication Year/Month	:	2001/07
Meeting title	:	7th International Conference on Nuclear Microprobe Technology and Applications
Held date	:	2000/09
Location (city)	:	Bordeaux
Location (country)	:	France
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0168-583X(01)00375-5
DOI for research data	:
Keywords	:	重イオンマイクロビーム; シングルイオンヒット; Si PINダイオード; 過渡電流波高; 照射損傷; ワイブル分布関数; 照射面積; 電荷収集; モンテカルロシミュレーション
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Article of JAEA R&D Review	:
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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:21.1 Category:Instruments & Instrumentation
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Registration No. : B20000035
JAEA Abstracts No. : 291105
Paper Submission No. : 18587

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