Beamlet-beamlet interaction in a multi-aperture negative ion source

Fujiwara, Yukio; Hanada, Masaya; Okumura, Yoshikazu; Watanabe, Kazuhiro; Kawai, Kenichi*

no abstracts in English

Language	:	English
Journal	:	Review of Scientific Instruments
Volume	:	71
Number	:	8
Pages	:	p.3059 - 3064
Publication Year/Month	:	2000/08
Meeting title	:
Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1063/1.1305515
DOI for research data	:
Keywords	:	Beamlet; Interaction; Multi-aperture; Negative; Ion Source; Deflection; NBI; Space Charge
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:55.17 Category:Instruments & Instrumentation
Altmetrics	:

Registration No. : A20000112
JAEA Abstracts No. : 300198
Paper Submission No. : 18785

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.