Soft X-ray reflectivity and structure evaluation of Ni/C/Ti/C multilayer X-ray mirrors for water-window region

Takenaka, Hisataka*; Ito, Hisashi*; Nagai, Komei*; Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research A
Volume	:	467-468
Number	:	Part1
Pages	:	p.341 - 344
Publication Year/Month	:	2001/07
Meeting title	:	7th International Conference on Synchrotron Radiation Instrumentation (SRI 2000)
Held date	:	2000/08
Location (city)	:	Berlin
Location (country)	:	Gernamy
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0168-9002(01)00320-5
DOI for research data	:
Keywords	:	軟X線; 多層膜; 反射率; 構造解析
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:83.28 Category:Instruments & Instrumentation
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Registration No. : B20000992
JAEA Abstracts No. : 300812
Paper Submission No. : 19290

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