Probing bulk states of correlated electron systems by high-resolution resonance photoemission

Sekiyama, Akira*; Iwasaki, T.*; Matsuda, K.*; Saito, Yuji ; Onuki, Yoshichika*; Suga, Shigemasa*

no abstracts in English

Language	:	English
Journal	:	Nature
Volume	:	403
Number	:	6768
Pages	:	p.396 - 398
Publication Year/Month	:	2000/01
Meeting title	:
Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1038/35000140
DOI for research data	:
Keywords	:	強相関電子系; 内部電子状態; 高分解能; 共鳴光電子分光
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:98.93 Category:Multidisciplinary Sciences
Altmetrics	:

Registration No. : A20000282
JAEA Abstracts No. : 290103
Paper Submission No. : 17823

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.