Language |
: | English |
---|---|---|
Journal |
: | |
Volume |
: | 51 |
Number |
: | Supple |
Pages |
: | p.S235 - S238 |
Publication Year/Month |
: | 2002/00 |
Meeting title |
: | 8th Conference on Frontiers of Electron Microscopy in Materials Science (FEMM 2000) |
Held date |
: | 2000/11 |
Location (city) |
: | Matsue |
Location (country) |
: | Japan |
Paper URL |
: | |
Keywords |
: | 高エネルギー重イオン照射; 高温超伝導体; 円柱状欠陥; 電顕観察; 電子励起によるエネルギー損失量; Time Dependence Line Sourceモデル |
Accesses |
: |
- Accesses |
---|---|---|
Altmetrics |
: |
[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.