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Journal Articles

Formation of atomically flat $$beta$$-FeSi$$_{2}$$/Si(100) interface using ion irradiated substrate

Sasase, Masato*; Yamamoto, Hiroyuki; Kurata, Hiroki*

Thin Solid Films, 520(9), p.3490 - 3492, 2012/02

https://doi.org/10.1016/j.tsf.2011.12.067
 Times Cited Count：0 Percentile：0.02(Materials Science, Multidisciplinary)

Thin uniform $$beta$$-FeSi$$_{2}$$ films were fabricated on ion irradiated Si(100) substrates to achieve an atomically flat interface. Ion irradiation produces a surface with more defects than chemical etching, however, it is expected that the presence of defects can promote the formation of compound films such as $$beta$$-FeSi$$_{2}$$ that require interdiffusion and reaction processes. However, excess defects can also result in random nucleation, poor crystallinity and a rough interface. Cross-sectional transmission electron microscopy was used to determine the optimum conditions for ion irradiation of the substrate to obtain a clear $$beta$$-FeSi$$_{2}$$/Si interface.

Journal Articles

Structure of beam tracks induced by swift heavy ions in Bi$$_{2}$$Sr$$_{2}$$CaCu$$_{2}$$O$$_{8}$$ superconductors

Sasase, Masato*; Okayasu, Satoru; Yamamoto, Hiroyuki; Kurata, Hiroki*; Hojo, Kiichi

Japanese Journal of Applied Physics, Part 1, 46(2), p.783 - 786, 2007/02

https://doi.org/10.1143/JJAP.46.783

Columnar defects are produced in semiconducting and insulating materials by swift heavy ion irradiation. In the present study, we investigate the columnar defects produced in the Bi$$_{2}$$Sr$$_{2}$$CaCu$$_{2}$$O$$_{8}$$ superconductor by the heavy ion irradiation (Au$$^{+}$$, I$$^{+}$$, Br$$^{+}$$, Ni$$^{+}$$) in the energy range of 60-600 MeV. On the basis of the transmission electron microscopy, it is shown that the diameters of columnar defects become smaller and their distributions become narrower with the ion velocity. These facts are explained as the effect of nuclear collision by calculating the mean free path for the irradiated ions. Present results imply the nuclear collisions strongly affect the columnar defect formations even for the swift heavy ion irradiation.

Journal Articles

Structure of beam tracks induced by swift heavy ions in Bi$$_2$$Sr$$_2$$CaCu$$_2$$O$$_8$$ superconductors

Sasase, Masato*; Okayasu, Satoru; Yamamoto, Hiroyuki; Kurata, Hiroki*; Hojo, Kiichi

Japanese Journal of Applied Physics, Part 1, 46(2), p.783 - 786, 2007/02

https://doi.org/10.1143/JJAP.46.783
 Times Cited Count：1 Percentile：5.40(Physics, Applied)

Columnar defects are produced in semiconductor and insulator materials by swift heavy ion irradiation. It has been considered that the electronic stopping power of irradiating ions is the dominant factor in the formation of defects. However, our recent results suggest that ion-velocity is also an important parameter for use in describing this phenomenon. We investigate the columnar defects produced in Bi$$_2$$Sr$$_2$$CaCu$$_2$$O$$_8$$ (Bi-2212) superconductor by heavy ion irradiation (Au$$^{8+,12+}$$, I$$^{8+,29+}$$, Br$$^{12+}$$, and Ni$$^{11+}$$) in the energy range of 60-600MeV. From tansmission electron microscopy, it is shown that the diameters of columnar defects become smaller and their distribution become narrower with an increase in ion velocity. This is explained as an effect of nuclear collision by calculation of the mean free path for the irradiated ions. The present results imply that nuclear collisions strongly affect the formation of columnar defects, even for swift heavy ion irradiation.

Journal Articles

Defect structure of high-T$$_{c}$$ superconductor by high-energy heavy ion irradiation

Sasase, Masato; Okayasu, Satoru; Kurata, Hiroki; Hojo, Kiichi

Journal of Electron Microscopy, 51(Supple), p.S235 - S238, 2002/00

no abstracts in English

Journal Articles

Irradiated damage in high-Tc superconductor

Sasase, Masato; Okayasu, Satoru; Kurata, Hiroki; Hojo, Kiichi

Physica C, 357-360(Part.1), p.497 - 500, 2001/09

no abstracts in English

Journal Articles

High-resolution elemental mapping of titanium oxide/aluminum oxide multilayer by spectrum-imaging

Kurata, Hiroki; Kumagai, Hiroshi*; Ozasa, kazunari*

Journal of Electron Microscopy, 50(3), p.141 - 146, 2001/07

no abstracts in English

Journal Articles

Formation and migration of helium bubbles in Fe-16Cr-17Ni austenitic alloy at high temperature

Ono, K.*; Arakawa, Kazuto*; Ohashi, Masahiro*; Kurata, Hiroki; Hojo, Kiichi; Yoshida, Naoaki*

Journal of Nuclear Materials, 283-287(Part.1), p.210 - 214, 2000/12

https://doi.org/10.1016/S0022-3115(00)00143-4
 Times Cited Count：26 Percentile：82.52(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Spatially resolved electron energy-loss spectroscopy of the surface excitations on the insulating fine particle of aluminum oxide

Abe, Hiroyuki; Kurata, Hiroki; Hojo, Kiichi

Journal of the Physical Society of Japan, 69(5), p.1553 - 1557, 2000/05

https://doi.org/10.1143/JPSJ.69.1553
 Times Cited Count：4 Percentile：38.20(Physics, Multidisciplinary)

no abstracts in English

Journal Articles

On the grain boundary segregation of Sn in indium-tin-oxide thin films

Morikawa, Hiroshi*; Kurata, Hiroki; Fujita, Miya*

Journal of Electron Microscopy, 49(1), p.67 - 72, 2000/04

https://doi.org/10.1093/oxfordjournals.jmicro.a023794
 Times Cited Count：11 Percentile：51.36(Microscopy)

no abstracts in English

Journal Articles

Electron energy-loss spectroscopy

Kurata, Hiroki

Denshi Kenbikyo, 35(1), P. 68, 2000/03

no abstracts in English

Journal Articles

Branching ratio and L$$_{3}$$+L$$_{2}$$ intensities of 3d-transition metals in phthalocyanines and the amine complexes

Koshino, M.*; Kurata, Hiroki; Isoda, Shoji*; Kobayashi, Takashi*

Micron, 31(4), p.373 - 380, 2000/03

https://doi.org/10.1016/S0968-4328(99)00116-X
 Times Cited Count：12 Percentile：18.81(Microscopy)

no abstracts in English

Journal Articles

Defect structure of high-T$$_{c}$$ superconductor by high-energy heavy ion irradiation

Sasase, Masato; Sato, Takahiro*; Okayasu, Satoru; Kurata, Hiroki; Hojo, Kiichi

Advances in Superconductivity XII, p.314 - 316, 2000/00

no abstracts in English

Journal Articles

Change in chemical bonding states in electron-irradiated graphite

; ; Tanabe, Tetsuro*; Kurata, Hiroki; Hojo, Kiichi

Japanese Journal of Applied Physics, Part 1, 38(3A), p.1514 - 1515, 1999/03

https://doi.org/10.1143/JJAP.38.1514
 Times Cited Count：11 Percentile：48.47(Physics, Applied)

no abstracts in English

Journal Articles

Local state analysis by sub-nm electron probe

Kurata, Hiroki

Bunseki, 1999(12), p.1034 - 1035, 1999/00

https://ci.nii.ac.jp/naid/10004691708

no abstracts in English

Journal Articles

Structural change in graphite under electron irradiation of low temperatures

; Muto, Shunsuke*; Tanabe, Tetsuo*; Kurata, Hiroki; Hojo, Kiichi

Journal of Nuclear Materials, 271-272, p.280 - 284, 1999/00

https://doi.org/10.1016/S0022-3115(98)00714-4
 Times Cited Count：24 Percentile：83.87(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Advantages of elemental mapping by high-voltage EFTEM

Kurata, Hiroki

Ultramicroscopy, 78(1-4), p.233 - 240, 1999/00

https://doi.org/10.1016/S0304-3991(99)00023-6
 Times Cited Count：5 Percentile：46.60(Microscopy)

no abstracts in English

Journal Articles

Cluster model calculations for the Fe L$$_{2,3}$$-edge fine structure of $$alpha$$-Fe$$_{2}$$O$$_{3}$$

Kurata, Hiroki; Hojo, Kiichi; Uozumi, Takayuki*

Journal of Electron Microscopy, 47(4), p.293 - 299, 1998/00

https://doi.org/10.1093/oxfordjournals.jmicro.a023595
 Times Cited Count：6 Percentile：24.97(Microscopy)

no abstracts in English

Journal Articles

Polymerisation process of 1,6-di(N-carbazolyl)-2,4-hexadiyne epitaxially grown films studied by high-resolution electron microscopy

; Isoda, S.*; Kurata, Hiroki; ; ; Kobayashi, Takashi*

Polymer, 39(3), p.591 - 597, 1998/00

https://doi.org/10.1016/S0032-3861(97)00321-2
 Times Cited Count：5 Percentile：26.74(Polymer Science)

no abstracts in English

Journal Articles

Effect of Au$$^{24+}$$ ion irradiation on the superconductive properties and microstructure of EuBa$$_{2}$$Cu$$_{3}$$O$$_{x}$$ thin film

Sasase, Masato*; Okayasu, Satoru; Kurata, Hiroki; Hojo, Kiichi

Surface & Coatings Technology, 103-104, p.360 - 364, 1998/00

no abstracts in English

Journal Articles

Importance of relativistic effect on inelastic scattering cross-sections for quantitative microanalysis

Kurata, Hiroki; P.Wahlbring*; Isoda, S.*; Kobayashi, Takashi*

Micron, 28(5), p.381 - 388, 1997/00

https://doi.org/10.1016/S0968-4328(97)00044-9
 Times Cited Count：10 Percentile：31.96(Microscopy)

no abstracts in English

21 (Records 1-20 displayed on this page)