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Journal Articles

Degradation of charge collection efficiency for 6H-SiC diodes by electron irradiation

Iwamoto, Naoya; Onoda, Shinobu; Hishiki, Shigeomi; Oshima, Takeshi; Murakami, Makoto*; Nakano, Itsuo*; Kawano, Katsuyasu*

Materials Science Forum, 600-603(Part 2), p.1043 - 1046, 2009/00

The 6H-SiC n$$^{+}$$p diodes were fabricated on a p-type substrate. To clarify the radiation resistance of the device performance, the diodes were irradiated with 1MeV-electrons at fluence up to 6$$times$$10$$^{16}$$/cm$$^{2}$$ and the Charge Collection Efficiencies (CCEs) and diffusion length (L) of minority carriers were evaluated from the evaluation of the Transient Ion Beam Induced Current (TIBIC). The saturated CCE of 93% was obtained for non-electron irradiated diodes, and the value of CCE was kept up to electron fluences of 1$$times$$10$$^{15}$$/cm$$^{2}$$, although L decreased to 0.6$$mu$$m from 2.5$$mu$$m by the irradiation. The degradation of CCE was observed at fluences above 5$$times$$10$$^{15}$$/cm$$^{2}$$.

Journal Articles

Charge collection properties of 6H-SiC diodes by wide variety of charged particles up to several hundreds MeV

Onoda, Shinobu; Iwamoto, Naoya; Murakami, Makoto; Oshima, Takeshi; Hirao, Toshio; Kojima, Kazutoshi*; Kawano, Katsuyasu*; Nakano, Itsuo*

Materials Science Forum, 615-617, p.861 - 864, 2009/00

no abstracts in English

Journal Articles

Charge collection efficiency of 6H-SiC diodes damaged by electron irradiation

Iwamoto, Naoya; Oshima, Takeshi; Onoda, Shinobu; Hishiki, Shigeomi*; Murakami, Makoto; Nakano, Itsuo*; Kawano, Katsuyasu*

Proceedings of the 26th Symposium on Materials Science and Engineering, Research Center of Ion Beam Technology Hosei University, p.27 - 30, 2007/12

no abstracts in English

Oral presentation

Charge collection efficiency for electron irradiated 6H-SiC PN diodes

Iwamoto, Naoya; Onoda, Shinobu; Hishiki, Shigeomi; Oshima, Takeshi; Murakami, Makoto*; Nakano, Itsuo*; Kawano, Katsuyasu*

no journal, , 

no abstracts in English

Oral presentation

Electron irradiation effects on charge collection efficiency for 6H-SiC n$$^{+}$$p diodes

Iwamoto, Naoya; Oshima, Takeshi; Onoda, Shinobu; Hishiki, Shigeomi*; Murakami, Makoto

no journal, , 

no abstracts in English

5 (Records 1-5 displayed on this page)
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