Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Van Rooyen, I. J.*; Ivan, L.*; Messner, M.*; Edwards, L.*; Abonneau, E.*; Kamiji, Yu; Lowe, S.*; Nilsson, K.-F.*; Okajima, Satoshi; Pouchon, M.*; et al.
Proceedings of 4th International Conference on Generation IV and Small Reactors (G4SR-4), p.2 - 12, 2022/10
Ohshima, Hiroyuki; Morishita, Masaki*; Aizawa, Kosuke; Ando, Masanori; Ashida, Takashi; Chikazawa, Yoshitaka; Doda, Norihiro; Enuma, Yasuhiro; Ezure, Toshiki; Fukano, Yoshitaka; et al.
Sodium-cooled Fast Reactors; JSME Series in Thermal and Nuclear Power Generation, Vol.3, 631 Pages, 2022/07
This book is a collection of the past experience of design, construction, and operation of two reactors, the latest knowledge and technology for SFR designs, and the future prospects of SFR development in Japan. It is intended to provide the perspective and the relevant knowledge to enable readers to become more familiar with SFR technology.
Toyoda, Satoshi*; Yoshimura, Masashi*; Sumida, Hirosuke*; Mineoi, Susumu*; Machida, Masatake*; Yoshigoe, Akitaka; Yoshikawa, Akira*; Suzuki, Satoru*; Yokoyama, Kazushi*
Hoshako, 35(3), p.200 - 206, 2022/05
The present status of spatiotemporal depth profiling analysis of the multilayer stacked film interface based on Ambient Pressure X-ray Photoelectron Spectroscopy (APXPS) is presented. To begin with, depth profiles of the multilayer stacked film interfaces have been achieved by time-division Near Ambient Pressure Hard X-ray Angle-Resolved PhotoEmission Spectroscopy data. We then have promoted our methods to quickly perform peak fittings and depth profiling from time-division angle resolved AP-XPS data including spatial resolution, which enables us to realize spatiotemporal depth profiles of the interfaces under reaction conditions such as oxidation and reduction. In addition, it is found that the traditional maximum entropy method (MEM) combined with Jackknife averaging of sparse modeling is effective to perform dynamic measurement of depth profiles with high precision.
measurement and analysis techniques in X-ray photoelectron spectroscopy; From NAP-HARPES to 4D-XPSToyoda, Satoshi*; Yamamoto, Tomoki*; Yoshimura, Masashi*; Sumida, Hirosuke*; Mineoi, Susumu*; Machida, Masatake*; Yoshigoe, Akitaka; Suzuki, Satoru*; Yokoyama, Kazushi*; Ohashi, Yuji*; et al.
Vacuum and Surface Science, 64(2), p.86 - 91, 2021/02
We have developed measurement and analysis techniques in X-ray photoelectron spectroscopy. To begin with, time-division depth profiles of gate stacked film interfaces have been achieved by NAP-HARPES (Near Ambient Pressure Hard X-ray Angle-Resolved Photo Emission Spectroscopy) data. We then have promoted our methods to quickly perform peak fittings and depth profiling from time-division ARPES data, which enables us to realize 4D-XPS analysis. It is found that the traditional maximum entropy method (MEM) combined with Jackknife averaging of sparse modeling in NAP-HARPES data is effective to perform dynamic measurement of depth profiles with high precision.
Onizawa, Takashi; Toyota, Kodai; Imagawa, Yuya; Okajima, Satoshi; Ando, Masanori
no journal, ,
In order to realize a fast reactor that achieves both safety and economic efficiency at a high level, Japan Atomic Energy Agency (JAEA) is developing the material strength standard for fast reactor design. JAEA has developed the material strength standard based on the acquired data and its evaluation results, and the standard have been incorporated in the Japan Society of Mechanical Engineers (JSME) code, Rules on the Design and Construction of Nuclear Power Plants, Section II, Fast Reactors (JSME D&C FRs Code). This paper describes the standard that recently incorporated in the JSME D&C FRs code and ongoing studies for improvements in the near future.
