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論文

Spin-current probe for phase transition in an insulator

Qiu, Z.*; Li, J.*; Hou, D.*; Arenholz, E.*; N'Diaye, A. T.*; Tan, A.*; 内田 健一*; 佐藤 浩司*; 岡本 聡*; Tserkovnyak, Y.*; et al.

Nature Communications (Internet), 7, p.12670_1 - 12670_6, 2016/08

 被引用回数:141 パーセンタイル:97.14(Multidisciplinary Sciences)

Spin fluctuation and transition have always been one of the central topics of magnetism and condensed matter science. Experimentally, the spin fluctuation is found transcribed onto scattering intensity in the neutron-scattering process, which is represented by dynamical magnetic susceptibility and maximized at phase transitions. Importantly, a neutron carries spin without electric charge, and therefore it can bring spin into a sample without being disturbed by electric energy. However, large facilities such as a nuclear reactor are necessary. Here we show that spin pumping, frequently used in nanoscale spintronic devices, provides a desktop microprobe for spin transition; spin current is a flux of spin without an electric charge and its transport reflects spin excitation. We demonstrate detection of antiferromagnetic transition in ultra-thin CoO films via frequency-dependent spin-current transmission measurements, which provides a versatile probe for phase transition in an electric manner in minute devices.

論文

Extending resonant inelastic X-ray scattering to the extreme ultraviolet

Wray, L. A.*; Huang, S.-W.*; Jarrige, I.*; 池内 和彦*; 石井 賢司; Li, J.*; Qiu, Z. Q.*; Hussain, Z.*; Chuang, Y.-D.*

Frontiers in Physics (Internet), 3, p.32_1 - 32_11, 2015/05

 被引用回数:4

In resonant inelastic X-ray scattering (RIXS), core hole resonance modes are used to enhance coupling between photons and low energy electronic degrees of freedom. Resonating with shallow core holes accessed in the extreme ultraviolet (EUV) can provide greatly improved energy resolution at standard resolving power, but has been found to often yield qualitatively different spectra than similar measurements performed with higher energy X-rays. This paper uses experimental data and multiplet-based numerical simulations for the M-edges of Co-, Ni-, and Cu-based Mott insulators to review the properties that distinguish EUV RIXS from more commonly performed higher energy measurements. Key factors such as the origin of the strong EUV elastic line and advantages of EUV spectral functions over soft X-ray RIXS for identifying intrinsic excitation line shapes are discussed.

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