Fundamental research of X-ray absorption imaging for elemental identification using a secondary target

Nakae, Masanori*; Matsuyama, Tsugufumi*; Murakami, Masashi; Yoshida, Yukihiko; Machida, Masahiko; Tsuji, Koichi*

Advances in X-Ray Chemical Analysis, Japan, 54, p.89 - 99, 2023/03

Fundamental research on X-ray absorption imaging for elemental identification was studied. A secondary target was applied to obtain X-ray absorption images above and below the X-ray absorption edge of the target element. X-rays from an X-ray tube were irradiated to the secondary target, where the characteristic X-rays were emitted that were irradiated to the sample. X-ray absorption images were acquired with an exposure time of a few seconds with an X-ray camera. In this technique, it is difficult to change the energy of X-rays as we want, however we can apply this technique for imaging the specific element. Metal foil sample composed of Al, Cu, and Ni was analyzed. To obtain an X-ray elemental image of Ni, two X-ray absorption images were taken using the X-rays above and below the Ni K-edge. X-rays of Cu K and Zn K were prepared by using Cu and Zn plates as the secondary target. Finally, the Ni elemental image was obtained by subtracting two images. Furthermore, the X-ray camera had a function of setting critical energies for imaging, thus it was demonstrated that an X-ray elemental image of Ni was obtained using a single secondary target without changing the secondary target.