Elemental sensitivity in soft X-ray imaging with a laser-plasma source and a color center detector

Calegari, F.*; Valentini, G.*; Vozzi, C.*; Benedetti, E.*; Cabanillas-Gonzalez, J.*; Faenov, A. Y.; Gasilov, S.*; Pikuz, T.*; Poletto, L.*; Sansone, G.*; et al.

Optics Letters, 32(17), p.2593 - 2595, 2007/09

https://doi.org/10.1364/OL.32.002593

Elemental sensitivity in soft X-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft X-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers.