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渡部 創; 高畠 容子; 小木 浩通*; 大杉 武史; 谷口 拓海; 佐藤 淳也; 新井 剛*; 梶並 昭彦*
Journal of Nuclear Materials, 585, p.154610_1 - 154610_6, 2023/11
被引用回数:0 パーセンタイル:0.01(Materials Science, Multidisciplinary)Treatment of spent scintillation cocktail generated by analysis of radioactivity is one of important tasks for management of nuclear laboratories. This study proposed a procedure consists of adsorption of radioactivity and solidification of residual liquid wastes, and fundamental performance of each step was experimentally tested. Batch-wise adsorption showed excellent adsorption performance of Ni onto silica-based adsorbent, and chelate reaction was suggested as the adsorption mechanism by EXAFS analysis. Alkaline activate material successfully solidified the liquid waste, and TG/DTA and XRD analyses revealed that the organic compounds exist inside the matrix. Only 1% of the loaded organic compounds were leaked from the matrix by a leaching test, and most of the organic compounds should be stably kept inside the matrix.
徳久 淳師*; 新井 淳也*; 城地 保昌*; 大野 善之*; 亀山 豊久*; 山本 啓二*; 畑中 正行*; Gerofi, B.*; 島田 明男*; 黒川 原佳*; et al.
Journal of Synchrotron Radiation, 20(6), p.899 - 904, 2013/11
被引用回数:5 パーセンタイル:29.00(Instruments & Instrumentation)Single-particle coherent X-ray diffraction imaging using X-ray free electron laser has potential to reveal a three-dimensional structure of a biological supra-molecule at sub-nano meter resolution. In order to realize this method, it is necessary to analyze as many as one million noisy X-ray diffraction patterns, each for an unknown random target orientation. To cope with the severe quantum noise we need to classify patterns according to their similarities and average similar patterns to improve the S/N ratio. We developed a high-speed scalable scheme to carry out classification on the K computer, a 10PFLOPS supercomputer at RIKEN Advanced Institute for Computational Science. It is designed to work on the real time basis with the experimental diffraction pattern collection at the X-ray free electron laser facility SACLA so that the result of classification can be feed-backed to optimize experimental parameters during the experiment. We report the present status of our effort of developing the system and also a result of application to a set of simulated diffraction patterns. We succeeded in classification of about one million diffraction patterns by running 255 separate one-hour jobs on 385-node mode.