Quantitative X-ray diffraction analysis of solute-enriched stacking faults in -Mg alloys based on peak asymmetry analysis

江草 大佑*; 眞鍋 怜*; 川崎 卓郎; Harjo, S.; 佐藤 成男*; 阿部 英司*

Materials Today Communications (Internet), 31, p.103344_1 - 103344_6, 2022/06

https://doi.org/10.1016/j.mtcomm.2022.103344

Based on X-ray diffraction analysis we attempt to quantify a volume fraction of stacking faults, which are essentially enriched by solute elements (solute-enriched stacking faults; SESFs) in Mg-Zn-Gd alloys with a hexagonal-close-packed () structure. We find that the SESFs with a local face-center-cubic stacking mostly occurs as a limited thickness less than several unit-cell dimensions, causing anisotropic broadening of the diffraction peaks including -component. By dealing the SESFs as intergrowth-like precipitates, we have successfully decomposed the asymmetric peak profile into the -matrix and the SESF peaks, by which the relevant volume fractions can be estimated in a highly quantitative manner.