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佐藤 成男*; 黒田 あす美*; 佐藤 こずえ*; 熊谷 正芳*; Harjo, S.; 友田 陽*; 齋藤 洋一*; 轟 秀和*; 小貫 祐介*; 鈴木 茂*
鉄と鋼, 104(4), p.201 - 207, 2018/00
被引用回数：9 パーセンタイル：44.29(Metallurgy & Metallurgical Engineering)To investigate the characteristics of dislocation evolution in ferritic and austenitic stainless steels under tensile deformation, neutron diffraction line-profile analysis was carried out. The austenitic steel exhibited higher work hardening than the ferritic steel. The difference in the work hardening ability between the two steels was explained with the dislocation density estimated by the line-profile analysis. The higher dislocation density of the austenitic steel would originate from its lower stacking fault energy. Dislocation arrangement parameters indicated that the strength of interaction between dislocations in the austenitic steel was stronger than that in the ferritic steel.
小貫 祐介*; 星川 晃範*; 佐藤 成男*; 徐 平光; 石垣 徹*; 齋藤 洋一*; 轟 秀和*; 林 眞琴*
Journal of Applied Crystallography, 49(5), p.1579 - 1584, 2016/10
被引用回数：28 パーセンタイル：88.44(Chemistry, Multidisciplinary)The authors have developed texture measurement system on a time-of flight neutron diffractometer, iMATERIA (BL20, MLF/J-PARC, Japan). Quantitative Rietveld texture analysis for a duplex stainless steel was possible with one neutron beam exposure for several minutes without sample rotation. The minimum number of diffraction spectra required for the Rietveld texture analysis was experimentally determined as 
100. The suggested rapid measurement scheme used 132 spectra and determined volume fractions of texture components in both ferrite and austenite phases, quantitatively. This quantitative and rapid measurement scheme was established by utilizing the features of iMATERIA as a powder diffractometer, i.e. fairly high resolution in d-spacing and numerous detectors equipped in a wide range of scattering angle.
Cr
Te小林 正起*; 石田 行章*; Hwang, J. I.*; Song, G. S.*; 藤森 淳; Yang, C. S.*; Lee, L.*; Lin, H.-J.*; Huang, D.-J.*; Chen, C. T.*; et al.
New Journal of Physics (Internet), 10, p.055011_1 - 055011_15, 2008/05
被引用回数：15 パーセンタイル：64.38(Physics, Multidisciplinary)The electronic structure of the Cr ions in the diluted ferromagnetic semiconductor ZnCrTe (
=0.03 and 0.15) thin films has been investigated using X-ray magnetic circular dichroism (XMCD) and photoemission spectroscopy (PES). The line shape of the Cr 
XMCD spectra is independent of 
, 
, and , indicating that the ferromagnetism is originated from the same electronic states of the Cr ion. Cluster-model analysis indicates that the ferromagnetic XMCD signal is originated from Cr ions substituted for the Zn site. The Cr 
partial density of states extracted using Cr 
resonant PES shows a broad feature near the top of the valence band, suggesting strong 
,
-
hybridization. Based on these findings, we conclude that double exchange mechanism cannot explain the ferromagnetism in ZnCr
Te.
