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Journal Articles

Magnetic sensitivity distribution of Hall devices in antiferromagnetic switching experiments

Schreiber, F.*; Meer, H.*; Schmitt, C.*; Ramos, R.*; Saito, Eiji; Baldrati, L.*; Kl$"a$ui, M.*

Physical Review Applied (Internet), 16(6), p.064023_1 - 064023_9, 2021/12

https://doi.org/10.1103/PhysRevApplied.16.064023
 Times Cited Count：3 Percentile：21.40(Physics, Applied)

Journal Articles

Direct imaging of current-induced antiferromagnetic switching revealing a pure thermomagnetoelastic switching mechanism in NiO

Meer, H.*; Schreiber, F.*; Schmitt, C.*; Ramos, R.*; Saito, Eiji; Gomonay, O.*; Sinova, J.*; Baldrati, L.*; Kl$"a$ui, M.*

Nano Letters, 21(1), p.114 - 119, 2021/01

https://doi.org/10.1021/acs.nanolett.0c03367
 Times Cited Count：57 Percentile：96.28(Chemistry, Multidisciplinary)

Journal Articles

Concurrent magneto-optical imaging and magneto-transport readout of electrical switching of insulating antiferromagnetic thin films

Schreiber, F.*; Baldrati, L.*; Schmitt, C.*; Ramos, R.*; Saito, Eiji; Lebrun, R.*; Kl$"a$ui, M.*

Applied Physics Letters, 117(8), p.082401_1 - 082401_5, 2020/08

https://doi.org/10.1063/5.0011852
 Times Cited Count：27 Percentile：82.30(Physics, Applied)

Journal Articles

Efficient spin torques in antiferromagnetic CoO/Pt quantified by comparing field- and current-induced switching

Baldrati, L.*; Schmitt, C.*; Gomonay, O.*; Lebrun, R.*; Ramos, R.*; Saito, Eiji; Sinova, J.*; Kl$"a$ui, M.*

Physical Review Letters, 125(7), p.077201_1 - 077201_6, 2020/08

https://doi.org/10.1103/PhysRevLett.125.077201
 Times Cited Count：39 Percentile：90.35(Physics, Multidisciplinary)

Journal Articles

Mechanism of N$'e$el order switching in antiferromagnetic thin films revealed by magnetotransport and direct imaging

Baldrati, L.*; Gomonay, O.*; Ross, A.*; Filianina, M.*; Lebrun, R.*; Ramos, R.*; Leveille, C.*; Fuhrmann, F.*; Forrest, T. R.*; Maccherozzi, F.*; et al.

Physical Review Letters, 123(17), p.177201_1 - 177201_6, 2019/10

https://doi.org/10.1103/PhysRevLett.123.177201
 Times Cited Count：124 Percentile：98.09(Physics, Multidisciplinary)

Journal Articles

Antiferromagnetic NiO thickness dependent sign of the spin Hall magnetoresistance in $$gamma$$-Fe$$_2$$O$$_3$$/NiO/Pt epitaxial stacks

Dong, B.-W.*; Baldrati, L.*; Schneider, C.*; Niizeki, Tomohiko*; Ramos, R.*; Ross, A.*; Cramer, J.*; Saito, Eiji; Kl$"a$ui, M.*

Applied Physics Letters, 114(10), p.102405_1 - 102405_5, 2019/03

https://doi.org/10.1063/1.5080766
 Times Cited Count：12 Percentile：52.18(Physics, Applied)

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