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論文

Phase-contrast imaging of nanostructures by soft X rays from a femtosecond-laser plasma

Gasilov, S. V.*; Faenov, A. Y.; Pikuz, T. A.*; Skobelev, I. Yu.*; Calegari, F.*; Vozzi, C.*; Nisoli, M.*; Sansone, G.*; Valentini, G.*; De Silvestri, S.*; et al.

JETP Letters, 87(5), p.238 - 242, 2008/03

 被引用回数:16 パーセンタイル:67.16(Physics, Multidisciplinary)

The possibility of phase-contrast imaging of nanostructures has been analyzed with the use of solid targets irradiated by femtosecond laser pulses as a spatially coherent soft X-ray source and a LiF crystal as an X-ray detector having both the submicron spatial resolution in a wide field of view and a high contrast. It has allowed to obtain high-quality phase-contrast X-ray images of foils with various chemical compositions and a thickness of about 100 nm.

論文

Elemental sensitivity in soft X-ray imaging with a laser-plasma source and a color center detector

Calegari, F.*; Valentini, G.*; Vozzi, C.*; Benedetti, E.*; Cabanillas-Gonzalez, J.*; Faenov, A. Y.; Gasilov, S.*; Pikuz, T.*; Poletto, L.*; Sansone, G.*; et al.

Optics Letters, 32(17), p.2593 - 2595, 2007/09

 被引用回数:25 パーセンタイル:73.85(Optics)

Elemental sensitivity in soft X-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft X-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers.

論文

Extracting ion emission lines from femtosecond-laser plasma X-ray spectra heavily contaminated by spikes

Gasilov, S. V.*; Faenov, A. Y.; Pikuz, T. A.*; Villoresi, P.*; Poletto, L.*; Stagira, S.*; Calegari, F.*; Vozzi, C.*; Nisoli, M.*

Journal of Applied Physics, 102(6), p.063303_1 - 063303_7, 2007/00

 被引用回数:5 パーセンタイル:22.69(Physics, Applied)

Charged-coupled device (CCD) detectors are widely used nowadays for the registration of X-ray spectra of multicharged ions, generated in a plasma during interaction of ultrashort, ultraintenselaser pulses with solid targets. In this work we propose "mean to median" algorithm for the removal of noise from the X-ray spectra of femtosecondlaser plasma. Series of spectra is necessary for the identification of corrupted data points by the developed method. The algorithm was tested with model spectra and was used for extracting information about spectral lines of Ne like ions of Fe XVII and He like Al ions which allowed to calculate plasma parameters. It is demonstrated that M2M method is able to clean spectra with more then 0.1 of corrupted pixels. The method is also valid if variations in spectral lines induced by fluctuations in laser beam intensity are present.

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