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Journal Articles

Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen

Kobayashi, Shingo*; Hasebe, Nobuyuki*; Hosojima, Takehiro*; Ishizaki, Takeshi*; Iwamatsu, Kazuhiro*; Mimura, Mitsuteru*; Miyachi, Takashi*; Miyajima, Mitsuhiro*; Pushkin, K.*; Tezuka, Chikara*; et al.

Japanese Journal of Applied Physics, Part 1, 45(10A), p.7894 - 7900, 2006/10

https://doi.org/10.1143/JJAP.45.7894

Times Cited Count：13 Percentile：44.89(Physics, Applied)

We have obtained the ratio of transverse diffusion coeffcient to mobility of electrons multiplied by the elementary charge, in Xe and Xe+H $_{2}$ under electric fields at a higher pressure of 1 MPa in comparison with preceding experiments. The result shows that the density effect (non-linear effect) of the ratio in both of pure Xe and Xe+H $_{2}$ is 15% below 1 MPa over the reduced electric field range from 0.08 to 0.610 $^{-17}$ Vcm $^{2}$ . We also found that the diffusion of an electron swarm is suppressed by adding trace of hydrogen to high-pressure xenon gas. Discussion is made of Xe+H $_{2}$ gas to a new -ray camera. Trace of hydrogen to high-pressure xenon gas. Discussion is made of Xe+H $_{2}$ gas to a new -ray camera.