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Faenov, A. Ya.*; Skobelev, I. Yu.*; Pikuz, T.; Pikuz, S. A.*; Fortov, V. E.*; Fukuda, Yuji; Hayashi, Yukio; Pirozhkov, A. S.; Kotaki, Hideyuki; Shimomura, Takuya; et al.
Laser and Particle Beams, 30(3), p.481 - 488, 2012/09
Times Cited Count:11 Percentile:42.67(Physics, Applied)Ishino, Masahiko; Faenov, A.*; Tanaka, Momoko; Hasegawa, Noboru; Nishikino, Masaharu; Tamotsu, Satoshi*; Pikuz, S.*; Inogamov, N. A.*; Zhakhovsky, V. V.*; Skobelev, I.*; et al.
AIP Conference Proceedings 1465, p.236 - 240, 2012/07
Times Cited Count:2 Percentile:62.84(Physics, Applied)We irradiated the focusing soft X-ray laser pulses having a wavelength of 13.9 nm and the duration of 7 ps to aluminum surface. After the irradiation process, the irradiated surface was observed with a scanning electron microscope. The surface modifications caused by soft X-ray laser single pulse exposure were clearly seen. In addition, it was found that the conical structures having around 100 nm in diameters were formed in the shallow features. The nano-meter size modified surface structures on aluminum induced by the soft X-ray laser pulse is interesting as the newly surface structure. Hence, the soft X-ray laser beam would be a candidate for a tool of micromachining. We also provide a thermomechanical modeling of the soft X-ray laser interaction with aluminum briefly to explain the surface modification.
Pikuz, T.; Faenov, A.*; Skobelev, I.*; Fortov, V. E.*; Boldarev, A.*; Gasilov, V.*; Chen, L. M.*; Zhang, L.*; Yan, W.*; Yuan, D.*; et al.
AIP Conference Proceedings 1465, p.181 - 201, 2012/07
Times Cited Count:0 Percentile:0.00(Physics, Applied)Inogamov, N. A.*; Anisimov, S. I.*; Petrov, Y. V.*; Khokhlov, V. A.*; Zhakhovskii, V. V.*; Faenov, A. Ya.*; Pikuz, T.; Fortov, V. E.*; Skobelev, I. Y.*; Kato, Yoshiaki*; et al.
Journal of Optical Technology, 78(8), p.473 - 480, 2011/08
Times Cited Count:6 Percentile:32.40(Optics)Inogamov, N. A.*; Faenov, A. Ya.*; Zhakhovsky, V. V.*; Pikuz, T. A.*; Skobelev, I. Yu.*; Petrov, Y. V.*; Khokhlov, V. A.*; Shepelev, V. V.*; Anisimov, S. I.*; Fortov, V. E.*; et al.
Contributions to Plasma Physics, 51(5), p.419 - 426, 2011/06
Times Cited Count:20 Percentile:63.10(Physics, Fluids & Plasmas)Warm dense matter, arising under the action of ultrashort EUV-FEL pulse onto LiF dielectric crystal, is characterized by high temperature of conduction electrons, with their number density achieving values of the order of atom number density at maximum laser fluences in our experiments. Expansion of matter, heated and pressurized through the electron-ion energy exchange, gives rise to the spallative ablation at small fluences and gaseous outflow from a target in the case of large fluences. Ablation threshold is low in comparison with a longer nanosecond XRL.
Starikov, S. V.*; Stegailov, V. V.*; Norman, G. E.*; Fortov, V. E.*; Ishino, Masahiko; Tanaka, Momoko; Hasegawa, Noboru; Nishikino, Masaharu; Oba, Toshiyuki*; Kaihori, Takeshi; et al.
JETP Letters, 93(11), p.642 - 647, 2011/04
Times Cited Count:25 Percentile:75.00(Physics, Multidisciplinary)Ishino, Masahiko; Faenov, A. Ya.*; Tanaka, Momoko; Hasegawa, Noboru; Nishikino, Masaharu; Tamotsu, Satoshi*; Pikuz, T. A.*; Inogamov, N. A.*; Zhakhovskii, V. V.*; Skobelev, I. Yu.*; et al.
Journal of Applied Physics, 109(1), p.013504_1 - 013504_6, 2011/01
Times Cited Count:33 Percentile:76.30(Physics, Applied)no abstracts in English
Inogamov, N. A.*; Zhakhovsky, V. V.*; Faenov, A. Ya.*; Khokhlov, V. A.*; Shepelev, V. V.*; Skobelev, I. Y.*; Kato, Yoshiaki*; Tanaka, Momoko; Pikuz, T. A.*; Kishimoto, Maki; et al.
Applied Physics A, 101(1), p.87 - 96, 2010/10
Times Cited Count:34 Percentile:75.98(Materials Science, Multidisciplinary)Inogamov, N. A.*; Faenov, A. Ya.*; Zhakhovskii, V. V.*; Skobelev, I. Y.*; Khokhlov, V. A.*; Kato, Yoshiaki*; Tanaka, Momoko; Pikuz, T. A.*; Kishimoto, Maki; Ishino, Masahiko; et al.
Contributions to Plasma Physics, 51(4), p.361 - 366, 2010/05
Times Cited Count:19 Percentile:61.36(Physics, Fluids & Plasmas)Pikuz, T.; Faenov, A.*; Ishino, Masahiko; Starikov, S. V.*; Stegailov, V. V.*; Norman, G. E.*; Fortov, V.*; Skobelev, I.*; Inogamov, N. A.*; Zhakhovsky, V. V.*; et al.
no journal, ,
Faenov, A.*; Pikuz, T.; Ishino, Masahiko; Starikov, S. V.*; Stegailov, V. V.*; Norman, G.*; Fortov, V. E.*; Skobelev, I. Yu.*; Tamotsu, Satoshi*; Tanaka, Momoko; et al.
no journal, ,
Kawachi, Tetsuya; Ishino, Masahiko; Nishikino, Masaharu; Faenov, A.*; Pikuz, T.; Hasegawa, Noboru; Inogamov, N. A.*; Skobelev, I. Y.*; Fortov, V. E.*; Khohlov, V. A.*; et al.
no journal, ,
Laser ablation has many technological applications in material processing and nano-structure fabrication. The laser-induce damage of the materials has been intensively studied and its dependence upon the pulse width, the photon energy, and the fluence has come to be understood. Recently novel light sources in soft X-ray region, i.e., laser-based soft X-ray laser (SXRL) and X-FEL, become available, and the use of these light sources provide us new possibility of laser processing. SXRL interaction with materials is quite different from that of optical lasers: Dominant absorption process is photo-ionization which creates high energy photo-electrons with around 100 eV in localized surface layer of materials, and such a temperature growth increases the tensile stress which may induce the spallation of the surface layer or unexpected surface modification. In this presentation, we report an experimental and theoretical study of SXRL ablation and nano-scale surface modification of metals.
Faenov, A. Y.; Pikuz, T. A.*; Inogamov, N. A.*; Zhakhovski, V.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Kato, Yoshiaki*; Fukuda, Yuji; Tanaka, Momoko; et al.
no journal, ,
Inogamov, N. A.*; Faenov, A. Y.; Pikuz, T.*; Zhakhovski, V.*; Skobelev, I.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Fukuda, Yuji; Kato, Yoshiaki*; et al.
no journal, ,
Faenov, A. Y.; Pikuz, T.*; Inogamov, N. A.*; Zhakhovski, V.*; Skobelev, I.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Fukuda, Yuji; Kato, Yoshiaki*; et al.
no journal, ,
Ishino, Masahiko; Faenov, A. Ya.*; Tanaka, Momoko; Pikuz, T.; Tamotsu, Satoshi*; Hasegawa, Noboru; Nishikino, Masaharu; Starikov, S. V.*; Stegailov, V. V.*; Norman, G. E.*; et al.
no journal, ,