JAEA
  • help
  • PC | SP
  • JP | EN
          
Refine your search：     
Report No.
 - 
Clear All
Search Results: Records 1-8 displayed on this page of 8
  • 1

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

Total dose effects on heavy-ion induced gate current in MOS structure

Takahashi, Yoshihiro*; Fugane, Masaru*; Imagawa, Ryo*; Owaki, Akihiro*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

JAEA-Review 2008-055, JAEA Takasaki Annual Report 2007, P. 7, 2008/11

no abstracts in English

Oral presentation

Analysis of transport properties of charge induced in SOI structure devices by heavy ion irradiation

Onishi, Kazunori*; Takahashi, Yoshihiro*; Nakajima, Yasuhito*; Nagasawa, Takaharu*; Fugane, Masaru; Imagawa, Ryo*; Nomoto, Keisuke*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Investigation of the generation mechanism of transient current generated in oxide using TIBIC

Hirao, Toshio; Onoda, Shinobu; Fugane, Masaru; Takahashi, Yoshihiro*; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Charge collection mechanism of heavy-ion induced charge through an oxide layer

Fugane, Masaru; Takahashi, Yoshihiro*; Hirao, Toshio; Onoda, Shinobu; Nakajima, Yasuhito*; Onishi, Kazunori*

no journal, , 

no abstracts in English

Oral presentation

Heavy-ion induced gate current in MOSFET

Fugane, Masaru; Takahashi, Yoshihiro*; Nakajima, Yasuhito*; Nagasawa, Takaharu*; Imagawa, Ryo*; Nomoto, Keisuke*; Onishi, Kazunori*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Heavy ion induced transient currents on MOS capacitors before and after $$gamma$$ irradiation

Onoda, Shinobu; Fugane, Masaru; Hirao, Toshio; Oshima, Takeshi; Takahashi, Yoshihiro*; Imagawa, Ryo*; Onishi, Kazunori*

no journal, , 

no abstracts in English

Oral presentation

Relation between transient current induced in MOS devices by heavy ions and total dose effects

Imagawa, Ryo*; Fugane, Masaru*; Takahashi, Yoshihiro*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Clarification of single event effects in MOS structure devices

Takahashi, Yoshihiro*; Fugane, Masaru*; Imagawa, Ryo*; Owaki, Akihiro*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

8 (Records 1-8 displayed on this page)
  • 1