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VAl probed by soft X-ray spectroscopiesNagai, Kodai*; Fujiwara, Hidenori*; Aratani, Hidekazu*; Fujioka, Shuhei*; Yomosa, Hiroshi*; Nakatani, Yasuhiro*; Kiss, Takayuki*; Sekiyama, Akira*; Kuroda, Fumiaki*; Fujii, Hitoshi*; et al.
Physical Review B, 97(3), p.035143_1 - 035143_8, 2018/01
Times Cited Count：21 Percentile：70.17(Materials Science, Multidisciplinary)We have studied the electronic structure of ferrimagnetic MnVAl single crystals by means of soft X-ray absorption spectroscopy (XAS), X-ray absorption magnetic circular dichroism (XMCD), and resonant soft X-ray inelastic scattering (RIXS). We have successfully observed the XMCD signals for all the constituent elements. The Mn L
XAS and XMCD spectra are reproduced by spectral simulations based on density-functional theory, indicating the itinerant character of the Mn 3
states. On the other hand, the V 3 electrons are rather localized since the ionic model can qualitatively explain the V L XAS and XMCD spectra. This picture is consistent with local 
excitations revealed by the V L
RIXS.
Yoshida, Kensuke*; Fujioka, Shinsuke*; Higashiguchi, Takeshi*; Ugomori, Teruyuki*; Tanaka, Nozomi*; Kawasaki, Masato*; Suzuki, Yuhei*; Suzuki, Chihiro*; Tomita, Kentaro*; Hirose, Ryoichi*; et al.
Applied Physics Letters, 106(12), p.121109_1 - 121109_5, 2015/03
Times Cited Count：10 Percentile：38.07(Physics, Applied)Yoshida, Kensuke*; Fujioka, Shinsuke*; Higashiguchi, Takeshi*; Ugomori, Teruyuki*; Tanaka, Nozomi*; Ohashi, Hayato*; Kawasaki, Masato*; Suzuki, Yuhei*; Suzuki, Chihiro*; Tomita, Kentaro*; et al.
Applied Physics Express, 7(8), p.086202_1 - 086202_4, 2014/08
Times Cited Count：29 Percentile：73.72(Physics, Applied)We demonstrate high conversion efficiency for extreme ultraviolet (EUV) emission at 6.5-6.7 nm from multiple laser beam-produced one-dimensional spherical plasmas. Multiply charged-state ions produce strong resonance emission lines, which combine to yield intense unresolved transition arrays in Gd, Tb, and Mo. The maximum in-band EUV conversion efficiency was observed to be 0.8%, which is one of the highest values ever reported due to the reduction of plasma expansion loss.
Zhang, Z.*; Nishimura, Hiroaki*; Namimoto, Takura*; Fujioka, Shinsuke*; Arikawa, Yasunobu*; Nishikino, Masaharu; Kawachi, Tetsuya; Sagisaka, Akito; Hosoda, Hirokazu*; Orimo, Satoshi; et al.
Review of Scientific Instruments, 83(5), p.053502_1 - 053502_5, 2012/05
Times Cited Count：18 Percentile：62.3(Instruments & Instrumentation)X-ray line spectra ranging from 17 to 77 keV were quantitatively measured with a Laue spectrometer, composed of a cylindrically curved crystal and a detector. Either a visible CCD detector coupled with a CsI phosphor screen or an imaging plate can be chosen, depending on the signal intensities and exposure times. The absolute sensitivity of the spectrometer system was calibrated using pre-characterized laser-produced X-ray sources and radioisotopes. The integrated reflectivity for the crystal is in good agreement with predictions by an open code for X-ray diffraction. The energy transfer efficiency from incident laser beams to hot electrons, as the energy transfer agency for specific X-ray line emissions, is derived as a consequence of this work.
Ando, Toshinari; Hiyama, Tadao; Takahashi, Yoshikazu; Nakajima, Hideo; Kato, Takashi; Isono, Takaaki; Sugimoto, Makoto; Kawano, Katsumi; Koizumi, Norikiyo; Nunoya, Yoshihiko; et al.
IEEE Transactions on Applied Superconductivity, 10(1), p.568 - 571, 2000/03
Times Cited Count：10 Percentile：53.54(Engineering, Electrical & Electronic)no abstracts in English
Sn conductor joint for ITER model coilsTakahashi, Yoshikazu; Nunoya, Yoshihiko; Nishijima, Gen; Koizumi, Norikiyo; Matsui, Kunihiro; Ando, Toshinari; Hiyama, Tadao; Nakajima, Hideo; Kato, Takashi; Isono, Takaaki; et al.
IEEE Transactions on Applied Superconductivity, 10(1), p.580 - 583, 2000/03
Times Cited Count：20 Percentile：68.9(Engineering, Electrical & Electronic)no abstracts in English
Monguchi, Takuo*; Fujioka, Hiroshi*; Uragami, Takeshi*; Ono, Kanta*; Baba, Yuji; Oshima, Masaharu*
Journal of the Electrochemical Society, 147(2), p.741 - 743, 2000/02
Times Cited Count：5 Percentile：23.47(Electrochemistry)no abstracts in English
Ando, Toshinari; Hiyama, Tadao; Takahashi, Yoshikazu; Nakajima, Hideo; Kato, Takashi; Sugimoto, Makoto; Isono, Takaaki; Kawano, Katsumi; Koizumi, Norikiyo; Hamada, Kazuya; et al.
IEEE Transactions on Applied Superconductivity, 9(2), p.628 - 631, 1999/06
Times Cited Count：8 Percentile：51.51(Engineering, Electrical & Electronic)no abstracts in English
/Si InterfacesOshima, Masaharu*; *; Ono, Kanta*; Fujioka, Hiroshi*; *; Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Journal of Electron Spectroscopy and Related Phenomena, 88-91, p.603 - 607, 1998/00
Times Cited Count：5 Percentile：25.68(Spectroscopy)no abstracts in English
Koizumi, Norikiyo; *; Nunoya, Yoshihiko; Takahashi, Yoshikazu; Ando, Toshinari; Tsuji, Hiroshi; P.Michael*; A.Zhukovsky*; J.D.Hale*; R.Lations*; et al.
Proc. of Int. Cryogenic Engineering Conf. (ICEC17), p.523 - 526, 1998/00
no abstracts in English
*; *; Fujioka, T.*; *; Koizumi, Norikiyo; Ando, Toshinari; Tsuji, Hiroshi
IEEE Transactions on Applied Superconductivity, 7(2), p.215 - 218, 1997/06
Times Cited Count：5 Percentile：45.52(Engineering, Electrical & Electronic)no abstracts in English
Koizumi, Norikiyo; Takahashi, Yoshikazu; Nishi, Masataka; Isono, Takaaki; Tsuji, Hiroshi; *; *; Fujioka, T.*
JAERI-Research 97-002, 15 Pages, 1997/02
JAERI-Research-97-002.pdf:0.82MB
no abstracts in English
Koizumi, Norikiyo; Takahashi, Yoshikazu; Nishi, Masataka; Isono, Takaaki; Tsuji, Hiroshi; *; *; Fujioka, T.*
Cryogenics, 37(8), p.441 - 452, 1997/00
Times Cited Count：30 Percentile：77.87(Thermodynamics)no abstracts in English
*; Wachi, Y.*; Shimada, M.*; *; *; Hamajima, Takataro*; Fujioka, T.*; Nishi, Masataka; Tsuji, Hiroshi; Ando, Toshinari; et al.
IEEE Transactions on Applied Superconductivity, 3(1), p.480 - 483, 1993/03
Times Cited Count：4 Percentile：45.56(Engineering, Electrical & Electronic)no abstracts in English
Aoki, Nobuo*; *; *; *; Shimada, M.*; Hamajima, Takataro*; *; Fujioka, T.*; Takahashi, Yoshikazu; Ando, Toshinari; et al.
Cryogenics, 33(6), p.581 - 585, 1993/00
Times Cited Count：2 Percentile：17.83(Thermodynamics)no abstracts in English
Wachi, Y.*; *; *; *; Fujioka, T.*; Nakajima, Hideo; Sugimoto, Makoto; Koizumi, Koichi; Yoshida, Kiyoshi; *; et al.
Cryogenics, 33(6), p.603 - 608, 1993/00
Times Cited Count：2 Percentile：17.83(Thermodynamics)no abstracts in English
Nishi, Masataka; Ando, Toshinari; Tsuji, Hiroshi; *; Hamajima, Takataro*; Fujioka, T.*
Teion Kogaku, 27(3), p.207 - 216, 1992/00
no abstracts in English
Aoki, Nobuo*; *; *; *; Shimada, M.*; Hamajima, Takataro*; *; Fujioka, T.*; Takahashi, Yoshikazu; Ando, Toshinari; et al.
Teion Kogaku, 27(3), p.221 - 225, 1992/00
no abstracts in English
Wachi, Y.*; *; *; *; Fujioka, T.*; Nakajima, Hideo; Sugimoto, Makoto; Koizumi, Koichi; Yoshida, Kiyoshi; *; et al.
Teion Kogaku, 27(3), p.245 - 251, 1992/00
no abstracts in English
Nishi, Masataka; Tsuji, Hiroshi; Takahashi, Yoshikazu; Nakajima, Hideo; Isono, Takaaki; Ando, Toshinari; Shimamoto, Susumi; *; Hamajima, Takataro*; *; et al.
Proc. of the 11th Int. Conf. on Magnet Technology,Vol. 2, p.856 - 861, 1990/00
no abstracts in English
*; *; *; Hamajima, Takataro*; Fujioka, T.*; *; Shimamoto, Susumi; Nishi, Masataka; Nakajima, Hideo; Ando, Toshinari; et al.
IEEE Transactions on Magnetics, 24(2), p.1149 - 1152, 1988/00
Times Cited Count：2 Percentile：41.43(Engineering, Electrical & Electronic)no abstracts in English
