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Zhao, Y.*; Suzuki, T.*; Iimori, T.*; Kim, H.-W.*; Ahn, J. R.*; Horio, Masafumi*; Sato, Yusuke*; Fukaya, Yuki; Kanai, T.*; Okazaki, K.*; et al.
Physical Review B, 105(11), p.115304_1 - 115304_8, 2022/03
Times Cited Count:1 Percentile:9.28(Materials Science, Multidisciplinary)no abstracts in English
Fukaya, Yuki; Zhao, Y.*; Kim, H.-W.*; Ahn, J.-R.*; Fukidome, Hirokazu*; Matsuda, Iwao*
Physical Review B, 104(18), p.L180202_1 - L180202_5, 2021/11
Times Cited Count:14 Percentile:71.29(Materials Science, Multidisciplinary)no abstracts in English
Hasegawa, Mika*; Sugawara, Kenta*; Suto, Ryota*; Sambonsuge, Shota*; Teraoka, Yuden; Yoshigoe, Akitaka; Filimonov, S.*; Fukidome, Hirokazu*; Suemitsu, Maki*
Nanoscale Research Letters, 10, p.421_1 - 421_6, 2015/10
Times Cited Count:18 Percentile:54.73(Nanoscience & Nanotechnology)Graphene has attracted much attention as a promising material in electronics and photonics. The graphitization temperature of 1473 K or higher of graphene-on-silicon(GOS), however, is still too high to be fully compatible with the Si technology. Here, the first application of Ni-assisted formation of graphene to the GOS method was reported. We demonstrate that the graphene formation temperature can be reduced by more than 200 K by this method. Moreover, solid-phase reactions during heating/annealing/cooling procedures have been investigated in detail by using synchrotron-radiation X-ray photoelectron spectroscopy. As a result, we clarify the role of Ni/SiC reactions, in which not only Ni silicidation and but also Ni carbonization is suggested as a key process in the formation of graphene.
Suemitsu, Maki*; Fukidome, Hirokazu*; Teraoka, Yuden
NanotechJapan Bulletin (Internet), 7(2), 5 Pages, 2014/04
no abstracts in English
Ide, Takayuki*; Kawai, Yusuke*; Handa, Hiroyuki*; Fukidome, Hirokazu*; Kotsugi, Masato*; Okochi, Takuo*; Enta, Yoshiharu*; Kinoshita, Toyohiko*; Yoshigoe, Akitaka; Teraoka, Yuden; et al.
Japanese Journal of Applied Physics, 51(6), p.06FD02_1 - 06FD02_4, 2012/06
Times Cited Count:7 Percentile:29.62(Physics, Applied)Fukidome, Hirokazu*; Abe, Shunsuke*; Takahashi, Ryota*; Imaizumi, Kei*; Inomata, Shuya*; Handa, Hiroyuki*; Saito, Eiji*; Enta, Yoshiharu*; Yoshigoe, Akitaka; Teraoka, Yuden; et al.
Applied Physics Express, 4(11), p.115104_1 - 115104_3, 2011/11
Times Cited Count:35 Percentile:77.60(Physics, Applied)Fukidome, Hirokazu*; Takahashi, Ryota*; Abe, Shunsuke*; Imaizumi, Kei*; Handa, Hiroyuki*; Kang, H. C.*; Karasawa, Hiromi*; Suemitsu, Tetsuya*; Otsuji, Taiichi*; Enta, Yoshiharu*; et al.
Journal of Materials Chemistry, 21(43), p.17242 - 17248, 2011/11
Times Cited Count:28 Percentile:62.15(Chemistry, Physical)Takahashi, Ryota*; Handa, Hiroyuki*; Abe, Shunsuke*; Imaizumi, Kei*; Fukidome, Hirokazu*; Yoshigoe, Akitaka; Teraoka, Yuden; Suemitsu, Maki*
Japanese Journal of Applied Physics, 50(7), p.070103_1 - 070103_6, 2011/07
Times Cited Count:32 Percentile:75.28(Physics, Applied)Imaizumi, Kei*; Handa, Hiroyuki*; Takahashi, Ryota*; Saito, Eiji*; Fukidome, Hirokazu*; Enta, Yoshiharu*; Teraoka, Yuden; Yoshigoe, Akitaka; Suemitsu, Maki*
Japanese Journal of Applied Physics, 50(7), p.070105_1 - 070105_6, 2011/07
Times Cited Count:4 Percentile:18.54(Physics, Applied)Suemitsu, Maki*; Fukidome, Hirokazu*; Takahashi, Ryota*; Imaizumi, Kei*; Handa, Hiroyuki*; Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
Formation of SiC thin layers on Si substrates followed by annealing converts the top surface into graphene (graphene on silicon;GOS). Normally, 3C-SiC(111), (110) and (100)-oriented layers are grown on Si(111), (110) and (100) substrates, respectively. Not only 3C-SiC(111) but also 3C-SiC(100) and (110) surfaces, epitaxial graphene layers were produced. The Raman spectra showed the same bands for the three orientations. Synchrotron-radiation X-ray photoelectron spectrum of C1s presented sp carbon atoms for the three orientations. While no interfacial layers are formed on the SiC(100) and SiC(110), the interfacial layer does exist between the graphene and the SiC(111) film. The observation of the equally successful growth of graphene on these low-index SiC surfaces makes the GOS technology aviable in the post-Si device developments.
Fukidome, Hirokazu*; Takahashi, Ryota*; Miyamoto, Yu*; Handa, Hiroyuki*; Kang, H. C.*; Karasawa, Hiromi*; Suemitsu, Tetsuya*; Otsuji, Taiichi*; Yoshigoe, Akitaka; Teraoka, Yuden; et al.
no journal, ,
By forming an SiC thin film on Si substrates and by thermally converting the film top surface into graphene, a graphene layer can be epitaxially formed on the Si substrates (graphene on silicon;GOS). In this method, epitaxial SiC thin films are first grown on the silicon substrate by using gas source molecular beam epitaxy. Normally, 3C-SiC(111), (110) and (100)-oriented films are grown on Si(111), (110) and (100) substrates, respectively. The surface of SiC thin films is then thermally graphitized by annealing at 1523 K in UHV to sublimate Si atoms. Not only 3C-SiC(111) but also (100) and (110) surfaces, produced epitaxial graphene as well. The Raman spectra show distinct D, G and G' bands for all these orientations. Synchrotron-radiation X-ray photoelectron spectrum of C1s presents sp carbons atoms. The observation of the equally successful growth of graphene on these low-index SiC surfaces makes the GOS technology aviable in the post-Si device developments.
Takahashi, Ryota*; Handa, Hiroyuki*; Abe, Shunsuke*; Inomata, Shuya*; Imaizumi, Kei*; Fukidome, Hirokazu*; Teraoka, Yuden; Yoshigoe, Akitaka; Kotsugi, Masato*; Okochi, Takuo*; et al.
no journal, ,
no abstracts in English
Suemitsu, Maki*; Fukidome, Hirokazu*; Takahashi, Ryota*; Abe, Shunsuke*; Imaizumi, Kei*; Teraoka, Yuden; Yoshigoe, Akitaka
no journal, ,
no abstracts in English
Haramoto, Naoki*; Inomata, Shuya*; Takahashi, Ryota*; Yoshigoe, Akitaka; Teraoka, Yuden; Fukidome, Hirokazu*; Suemitsu, Maki*
no journal, ,
no abstracts in English
Hasegawa, Mika*; Sugawara, Kenta*; Suto, Ryota*; Sambonsuge, Shota*; Haramoto, Naoki*; Teraoka, Yuden; Yoshigoe, Akitaka; Fukidome, Hirokazu*; Suemitsu, Maki*
no journal, ,
no abstracts in English
Hasegawa, Mika*; Sugawara, Kenta*; Suto, Ryota*; Sambonsuge, Shota*; Haramoto, Naoki*; Teraoka, Yuden; Yoshigoe, Akitaka; Fukidome, Hirokazu*; Suemitsu, Maki*
no journal, ,
no abstracts in English
Hasegawa, Mika*; Suto, Ryota*; Sugawara, Kenta*; Sambonsuge, Shota*; Haramoto, Naoki*; Teraoka, Yuden; Yoshigoe, Akitaka; Fukidome, Hirokazu*; Suemitsu, Maki*
no journal, ,
no abstracts in English
Fukaya, Yuki; Zhao, Y.*; Kim, H.-W.*; Ahn, J.-R.*; Fukidome, Hirokazu*; Matsuda, Iwao*
no journal, ,
no abstracts in English
Inomata, Shuya*; Takahashi, Ryota*; Handa, Hiroyuki*; Imaizumi, Kei*; Fukidome, Hirokazu*; Suemitsu, Maki*; Teraoka, Yuden; Yoshigoe, Akitaka
no journal, ,
no abstracts in English
Sambonsuge, Shota*; Abe, Shunsuke*; Takahashi, Ryota*; Imaizumi, Kei*; Handa, Hiroyuki*; Yoshigoe, Akitaka; Teraoka, Yuden; Kotsugi, Masato*; Okochi, Takuo*; Kinoshita, Toyohiko*; et al.
no journal, ,
no abstracts in English