Resonant inelastic X-ray scattering study of intraband charge excitations in hole-doped high- cuprates

脇本 秀一; 石井 賢司; 木村 宏之*; 池内 和彦*; 吉田 雅洋*; 足立 匡*; Casa, D.*; 藤田 全基*; 福永 靖*; Gog, T.*; et al.

Physical Review B, 87(10), p.104511_1 - 104511_7, 2013/03

https://doi.org/10.1103/PhysRevB.87.104511

We have performed resonant inelastic X-ray scattering (RIXS) near the Cu- edge on various cuprate superconductors, covering underdoped to heavily overdoped regimes and focusing on charge excitations inside the charge-transfer gap. RIXS measurements with = 9.003 keV on metallic LaSrCuO and BiPbSrCuO exhibit a dispersive intraband excitation below 4 eV, similar to that observed in the electron-doped NdCeCuO. This is the first observation of a dispersive intraband excitation in a hole-doped system, evidencing that both electron- and hole-doped systems have a similar dynamical charge correlation function.