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Terauchi, Masami*; Koike, Masato; Fukushima, Kurio*; Kimura, Atsushi*
Journal of Electron Microscopy, 59(4), p.251 - 261, 2010/08
Times Cited Count：36 Percentile：87.32(Microscopy)Two types of wavelength-dispersive soft-X-ray spectrometers, a high-dispersion type and a conventional one, for transmission electron microscopes were constructed. Both spectrometers were extended energy regions 
2000 eV. The best energy resolution of 0.08 eV was obtained for an Al L-emission by using the high-dispersion type. W-M and Si-K emissions were clearly resolved by using the conventional type. Soft-X-ray emission spectroscopy based on transmission electron microscopy has an advantage for obtaining spectra from a single crystalline specimen with a defined crystal setting. From C K-emission spectra of single crystalline graphite with different crystal settings, density of states of 
- and 
-bondings were separately derived. Those results demonstrated a method to analyze the electronic states of valence electrons of materials in the nanometer scale based of transmission electron microscopy.
Terauchi, Masami*; Koike, Masato; Fukushima, Kurio*; Kimura, Jun*
Microscopy and Microanalysis, 12(Suppl.2), p.866 - 867, 2006/08
no abstracts in English
Terauchi, Masami*; Koike, Masato; Fukushima, Kurio*; Kimura, Jun*
no journal, ,
no abstracts in English
