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Nakazawa, Shinobu*; Teshima, Shotaro*; Arai, Daichi*; Miyagi, Daisuke*; Tsuda, Makoto*; Hamajima, Takataro*; Yagai, Tsuyoshi*; Nunoya, Yoshihiko; Koizumi, Norikiyo; Takahata, Kazuya*; et al.
Teion Kogaku, 46(8), p.474 - 480, 2011/08
It is observed that measured critical currents of a large current CIC conductor sample become lower than expected ones, since unbalanced current distribution is caused through contacting resistances between strands and Cu sleeves in CIC conductor joints. In order to evaluate the contacting length, we identify all strands 3 dimensional positions in the CIC conductor, and then we measure contacting number and lengths of strands which appear on surface of the cable for contacting with the Cu sleeves. It is found that some strands do not appear on the surface of cable and the contacting lengths are widely distributed with large standard deviation. We develop a numerical code which simulates strand positions in the CIC, and then compare the analyzed contacting strand number and contacting length with measured ones. It is found that the both results are in good agreement and hence the code is available for evaluating the contacting parameters. We vary twist pitches of sub-cables to search the contacting parameters and then show that all strands appear on the cable surface and have contacting lengths with small standard deviation. It is found that the twist pitches are a key parameter for optimization of the contacting parameters.
Yagai, Tsuyoshi*; Sato, Hidenari*; Tsuda, Makoto*; Hamajima, Takataro*; Nunoya, Yoshihiko; Takahashi, Yoshikazu; Okuno, Kiyoshi
IEEE Transactions on Applied Superconductivity, 16(2), p.835 - 838, 2006/06
Times Cited Count：7 Percentile：40.69(Engineering, Electrical & Electronic)AC losses in the CIC conductor consist of both regular loss that are proportional to cable twisting pitch squared and irregular loss that could not be estimated from short conductor sample results. It was explained from our previous works that irregular loops produce the losses with long time constants up to several hundred seconds. The observed long time constant indicates that contact conditions between the two strands forming the loop should be line contact. We traced the sample conductor with 1 m in length. The measured results show that large displacements of strands from their original positions due to compressing the conductor provide many line contacts. It is found that the averaged line contact length reaches about 10 mm that is three orders of magnitude larger than the 0.01 mm of point contact length.
Hamajima, Takataro*; Hanai, Satoshi*; Wachi, Yoshihiro*; Shimada, Mamoru*; Ono, Michitaka*; Martovetsky, N.*; Zbasnik, J.*; Moller, J.*; Takahashi, Yoshikazu; Matsui, Kunihiro; et al.
IEEE Transactions on Applied Superconductivity, 10(1), p.812 - 815, 2000/03
Times Cited Count：10 Percentile：53.54(Engineering, Electrical & Electronic)no abstracts in English
Sugimoto, Makoto; Isono, Takaaki; Tsuji, Hiroshi; Yoshida, Kiyoshi; *; Hamajima, Takataro*; Sato, Takashi*; Shinoda, K.*
Cryogenics, 38(10), p.989 - 994, 1998/00
Times Cited Count：4 Percentile：23.98(Thermodynamics)no abstracts in English
Hamajima, Takataro*; Shimada, Mamoru*; Ono, Michitaka*; Takigami, Hiroyuki*; Hanai, Satoshi*; Wachi, Yoshihiro*; Takahashi, Yoshikazu; Matsui, Kunihiro; Ito, Toshinobu*; Isono, Takaaki; et al.
Teion Kogaku, 33(7), p.492 - 499, 1998/00
no abstracts in English
*; Hanai, S.*; Wachi, Y.*; *; *; Hamajima, Takataro*; *; Koizumi, Norikiyo; Ando, Toshinari; Tsuji, Hiroshi; et al.
Teion Kogaku, 33(7), p.485 - 491, 1998/00
no abstracts in English
Wachi, Y.*; Hanai, S.*; *; *; *; Hamajima, Takataro*; *; Nakajima, Hideo; Tsuji, Hiroshi; Shinoda, K.*; et al.
Teion Kogaku, 33(7), p.479 - 484, 1998/00
no abstracts in English
*; Wachi, Y.*; Shimada, M.*; *; *; Hamajima, Takataro*; Fujioka, T.*; Nishi, Masataka; Tsuji, Hiroshi; Ando, Toshinari; et al.
IEEE Transactions on Applied Superconductivity, 3(1), p.480 - 483, 1993/03
Times Cited Count：4 Percentile：45.56(Engineering, Electrical & Electronic)no abstracts in English
Aoki, Nobuo*; *; *; *; Shimada, M.*; Hamajima, Takataro*; *; Fujioka, T.*; Takahashi, Yoshikazu; Ando, Toshinari; et al.
Cryogenics, 33(6), p.581 - 585, 1993/00
Times Cited Count：2 Percentile：17.83(Thermodynamics)no abstracts in English
Nishi, Masataka; Ando, Toshinari; Tsuji, Hiroshi; *; Hamajima, Takataro*; Fujioka, T.*
Teion Kogaku, 27(3), p.207 - 216, 1992/00
no abstracts in English
Aoki, Nobuo*; *; *; *; Shimada, M.*; Hamajima, Takataro*; *; Fujioka, T.*; Takahashi, Yoshikazu; Ando, Toshinari; et al.
Teion Kogaku, 27(3), p.221 - 225, 1992/00
no abstracts in English
Nishi, Masataka; Tsuji, Hiroshi; Takahashi, Yoshikazu; Nakajima, Hideo; Isono, Takaaki; Ando, Toshinari; Shimamoto, Susumi; *; Hamajima, Takataro*; *; et al.
Proc. of the 11th Int. Conf. on Magnet Technology,Vol. 2, p.856 - 861, 1990/00
no abstracts in English
Iida, Hiromasa; *; *; Adachi, Junichi*; *; *; Hamajima, Takataro*; Hatayama, Akiyoshi*; *; *; et al.
JAERI-M 88-011, 261 Pages, 1988/02
no abstracts in English
*; *; *; Hamajima, Takataro*; Fujioka, T.*; *; Shimamoto, Susumi; Nishi, Masataka; Nakajima, Hideo; Ando, Toshinari; et al.
IEEE Transactions on Magnetics, 24(2), p.1149 - 1152, 1988/00
Times Cited Count：2 Percentile：41.43(Engineering, Electrical & Electronic)no abstracts in English
Sato, Hidenori*; Yagai, Tsuyoshi*; Tsuda, Makoto*; Hamajima, Takataro*; Nunoya, Yoshihiko; Okuno, Kiyoshi
no journal, ,
no abstracts in English
