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Sumiya, Masatomo*; Sumita, Masato*; Tsuda, Yasutaka; Sakamoto, Tetsuya; Sang, L.*; Harada, Yoshitomo*; Yoshigoe, Akitaka
Science and Technology of Advanced Materials, 23(1), p.189 - 198, 2022/00
Times Cited Count:6 Percentile:39.26(Materials Science, Multidisciplinary)GaN is an attracting material for power-electronic devices. Understanding the oxidation at GaN surface is important for improving metal-oxide-semiconductor (MOS) devices. In this study, the oxidation at GaN surfaces depending on the GaN crystal planes (+c, -c, and m-plane) was investigated by real time XPS and DFT-MD simulation. We found that HO vapor has the highest reactivity due to the spin interaction between H
O and GaN surfaces. The bond length between the Ga and N on the -c GaN surface was increased by OH attacking the back side of three-fold Ga atom. The chemisorption on the m-plane was dominant. The intense reactions of oxidation and Al
Ga
N formation for p-GaN were observed at the interface of the Al
O
layer deposited by ALD using H
O vapor. This study suggests that an oxidant gas other than H
O and O
should be used to avoid unintentional oxidation during Al
Ga
N atomi layer deposition.
Nigo, Seisuke*; Kubota, Masato; Harada, Yoshitomo*; Hirayama, Taisei*; Kato, Seiichi*; Kitazawa, Hideaki*; Kido, Giyu*
Journal of Applied Physics, 112(3), p.033711_1 - 033711_6, 2012/08
Times Cited Count:65 Percentile:89.34(Physics, Applied)Sumiya, Masatomo*; Tsuda, Yasutaka; Sakamoto, Tetsuya*; Sumita, Masato*; Sang, L.*; Harada, Yoshitomo*; Yoshigoe, Akitaka
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no abstracts in English