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Shibata, Takanori*; Sugimura, Takashi*; Ikegami, Kiyoshi*; Takagi, Akira*; Sato, Masaharu*; Naito, Fujio*; Okoshi, Kiyonori; Hasegawa, Kazuo
JPS Conference Proceedings (Internet), 33, p.011009_1 - 011009_6, 2021/03
Upgrade of beam current in the Linac of Ibaraki Boron Neutron Capture Therapy (iBNCT) is one of the most important requirements to realize clinical trial. By 2018, the measurement of the produced neutrons characteristics and the neutron irradiation experiment for living cells have been done by producing 8-MeV proton beam current at the beryllium target with average current up to 2 mA. In order to satisfy the original clinical trial conditions, 5 mA average beam current is required at the target. For this goal, peak beam current extracted from the ion source should be increased to 60 mA from the present 30 mA with duty factor up to more than 10% (pulse width up to 1 ms and repetition rate up to more than 100 Hz). Stability of the peak current in the macro pulse is also important for the clinical application.
He and 
C dating in a granite, Tono area, central JapanHasegawa, Takuma*; Nakata, Kotaro*; Tomioka, Yuichi*; Goto, Kazuyuki*; Kashiwaya, Koki*; Hama, Katsuhiro; Iwatsuki, Teruki; Kunimaru, Takanori*; Takeda, Masaki
Geochimica et Cosmochimica Acta, 192, p.166 - 185, 2016/11
Times Cited Count：10 Percentile：38.39(Geochemistry & Geophysics)Groundwater dating was performed simultaneously by the He and C methods in granite of the Tono area in central Japan. Groundwater was sampled at 30 packed-off sections of six 1000-m boreholes. He concentrations increased and C concentrations decreased along a groundwater flow path on a topographic gradient. He ages were calculated by using the in situ He production rate derived from the porosity, density, and U and Th content of the rock, neglecting external flux. The linear relation between the He ages and the noncorrected C ages, except in the discharge area. Simultaneous measurements make it feasible to estimate the accumulation rate of He and initial dilution of C, which cannot be done with a single method. Cross-checking groundwater dating has the potential to provide more reliable groundwater ages.
Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Terauchi, Masami*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
Microscopy and Microanalysis, 20(Suppl.3), p.684 - 685, 2014/08
A novel wavelength dispersive soft X-ray emission spectrometer (SXES) having a X-ray energy range of 50-210 eV has been developed. One feature is that the SXES is parallel detection of the signals so that it can be used like a conventional energy dispersive spectrometer. The other is a high energy resolution, which is about 0.2 eV at Al-L comparable to those revealed by XPS and EELS. These features enable us to obtain meaningful information about chemical bonding in various bulk samples. The SXES can detect Li-K emission spectrum. In the case of an anode electrode of a lithium ion battery (LIB), two types of lithium peaks are observed: one lower energy peak at 50 eV and the other higher energy peak at 54 eV. It was found that the former peak corresponds to the amount of charging, whereas the latter corresponds to the metallic state of lithium.
Terauchi, Masami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
JAEA-Conf 2013-001, p.77 - 80, 2013/09
We have been developing a soft X-ray emission spectroscopy (SXES) instrument for electron microscopes (TEM, EPMA/SEM) with an extension of detectable energy range to 50-4000 eV. An introduction of valence electron spectroscopy with microscopy will supply fruitful information on bonding electrons, which cannot be obtained by EELS and EDS. For extend the lowest (or highest) detection energy upto 50 eV (or 4000 eV), a new laminar-type varied-line-spacing (VLS) grating, JS50XL, (or JS4000) has designed and manufactured. JS50XL and JS4000 having 1200 and 2400 lines/mm as well as coated by Au and a new multilayer-structure of W/B
C for a wide-band energy region of 2000-3800 eV, respectively. Those gratings were installed and tested in a SXES spectrometer attached to a TEM. The extension in lowest detection energy was confirmed by Mg-L emission (JS50XL). The energy resolution was 0.2 eV at Fermi edge of 49.5 eV. It can be also seen a sharp Fermi edge for Li-K emission spectrum of metal-Li. The high energy resolution was confirmed by Te-La emission at 3.8 keV (JS4000). The full width at half maximum of the peak was 27 eV. The detection energy range was successfully extended by using the two new VLS-gratings.
Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Terauchi, Masami*; Koeda, Masaru*; Nagano, Tetsuya*; et al.
JAEA-Conf 2013-001, p.13 - 15, 2013/09
A very unique high performance soft X-ray emission spectrometer (SXES) has successfully been developed which can be attached not only to transmission electron microscopes (TEMs), but also to scanning electron microscopes (SEMs) as well as electron probe microanalyzers (EPMAs). To extend the analyzed energy ranges, a newly designed laminar-type varied-line-spacing (VLS) grating JS50XL, for a lower energy range, 50-170 eV, and a multilayered VLS grating JS4000, for a higher energy range, 2000-4000 eV, have been developed and installed to this spectrometer. Application software has also been developed for a commercial use of SXES in several fields such as battery materials, steel and alloys, and electron devices. The appearance of this spectrometer attached to EPMA and a few results acquired are shown in the following figures. This development has been conducted as one of the projects of Collaborative Development of Innovative Seeds (Practicability verification stage) by Japan Science and Technology Agency.
Imazono, Takashi; Koike, Masato; Kawachi, Tetsuya; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; Yonezawa, Zeno*; Kuramoto, Satoshi*; et al.
Proceedings of SPIE, Vol.8848, p.884812_1 - 884812_14, 2013/09
Times Cited Count：7 Percentile：93.97(Optics)We have developed an objective soft X-ray flat-field spectrograph to be able to attach to electron microscopes. This spectrograph has two attractive features. One is that it is designed to cover a wide energy range of 50-4000 eV by using four varied-line-spacing holographic gratings optimized for 50-200 eV, 155-350 eV, 300-2200 eV, and 2000-4000 eV. They can be accommodated in the single spectrograph. The other is a newly invented W/B
C multilayer coating covering the 2000-4000 eV range. It can enhance the diffraction efficiency above a practical level of 
% at a constant incidence angle in the whole energy range.
Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Terauchi, Masami*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
Microscopy and Microanalysis, 19(Suppl.2), p.1258 - 1259, 2013/08
A new wavelength dispersive soft X-ray emission spectrometer (WD-SXES) consisting of newly developed diffraction gratings has been developed for soft X-ray emission spectroscopy. The WD-SXES with two types of diffraction gratings nominally covering an energy range between 50 and 210 eV has been installed to electron probe X-ray microanalyzers, JEOL JXA-8100, for commercial use. The energy resolution of this WD-SXES is nominally 0.3 eV, which is one order of magnitude better than that of conventional WDSs with layered dispersion elements. It is to be noted that the corresponding edge of Al
B is shifted to higher energy side by about 1 eV. One of the energy range was selected from 72 to 73.5 eV whereas the other was from 73.5 to 75 eV. The contrast in the former map is reversed in the later map as expected even though the energy difference between two maps is only 1.5 eV. The study confirms the high potential for the characterization especially for chemical state mapping.
and Sn-L
emissions of indium tin oxideTerauchi, Masami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
Microscopy, 62(3), p.391 - 395, 2013/06
Times Cited Count：11 Percentile：59.48(Microscopy)A new multilayer-coated varied line-spaced grating, JS4000, was fabricated and tested for extending the upper limit of a grating X-ray spectrometer for electron microscopy. This grating was designed for 2-3.8 keV at a grazing incidence angle of 1.35 deg. It was revealed that this new multilayer structure enables us to take soft-X-ray emission spectra continuously from 1.5 keV to 4 keV at the same optical setting. The full-width at half maximum of Te-L
(3.8 keV) emission peak was 27 eV. Sn-L (3444 eV) and In-L
(3487 eV) peaks, which cannot be resolved by a widely used energy-dispersive X-ray spectrometer.
Imazono, Takashi; Koike, Masato; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; Yonezawa, Zeno*; Kuramoto, Satoshi*; Terauchi, Masami*; et al.
Journal of Physics; Conference Series, 425(15), p.152008_1 - 152008_4, 2013/03
Times Cited Count：3 Percentile：79.34(Instruments & Instrumentation)We have developed a flat-field spectrograph equipped with a wide-band multilayer grating and prefocusing mirror for the 2-4 keV range. To realize a spectrograph without any mechanical movement, the multilayer has a newly invented layer structure to uniformly enhance the diffraction efficiency (or reflectivity) of the grating (or prefocusing mirror) at a fixed angle of incidence in the whole energy region. The multilayer structure consisting of W and BC layers has been deposited by ion beam sputtering method on a varied-line-spacing laminar-type holographic grating. Also the same multilayer has been done on a spherical substrate. The average diffraction efficiency (or reflectivity) of the multilayer grating (or spherical mirror) is in excess of 3% at 88.65
(or 4% at 88.00) in the 2.1-3.8 keV range. The throughput of the spectrograph with multilayer optics can be evaluated to be 2-5000 times higher than that with conventional optics coated by a gold layer.
Imazono, Takashi; Koike, Masato; Kawachi, Tetsuya; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; Yonezawa, Zeno*; Kuramoto, Satoshi*; et al.
AIP Conference Proceedings 1465, p.33 - 37, 2012/07
Times Cited Count：5 Percentile：84.73(Physics, Applied)Imazono, Takashi; Koike, Masato; Kawachi, Tetsuya; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; Yonezawa, Zeno*; Kuramoto, Satoshi*; et al.
Applied Optics, 51(13), p.2351 - 2360, 2012/05
Times Cited Count：12 Percentile：52.35(Optics)Laminar and blazed types holographic varied-line-spacing spherical gratings for use in a versatile soft X-ray flat-field spectrograph attached to an electron microscope are designed, fabricated, and evaluated. The absolute diffraction efficiencies of laminar (or blazed) master and replica gratings at 86.00 incidence evaluated by synchrotron radiation show over 5% (or 8%) in the 50-200 eV range with the maxima of 22% (or 26-27%). Also the resolving power evaluated by a laser produced plasma source is in excess of 700 at the energy near the 
emission spectrum of lithium (
55 eV) for all gratings. Moreover, the emission spectrum of metallic Li with high spectral resolution is successfully observed with the spectrograph attached to a transmission electron microscope.
emission spectrum of LiImazono, Takashi; Koike, Masato; Kawachi, Tetsuya; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; Yonezawa, Zeno*; Kuramoto, Satoshi*; et al.
Memoirs of the SR Center Ritsumeikan University, (14), p.131 - 144, 2012/05
We have developed a wavelength-dispersive soft X-ray spectrograph covering an energy region of 50-4000 eV to attach to a conventional electron microscope. The energy range was properly divided into four ranges of 50-200 eV, 155-350 eV, 300-2200 eV, and 2000-4000 eV, and a versatile spectrograph equipped with interchangeable multiple gratings optimized in the respective energy ranges has been developed. In particular, the grating that covers the 50-200 eV range can be used for the measurement of the emission spectrum ( 55 eV) of lithium. The diffraction efficiency evaluated by synchrotron radiation and resolving power measured by laser produced plasma sources are over 5% and in excess of 700, respectively. The emission spectrum of metallic Li with high spectral resolution has been successfully observed with the spectrograph attached to a transmission electron microscope.
Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Terauchi, Masami*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
Proceedings of Microscopy and Microanalysis 2011 (Internet), 2 Pages, 2011/08
Soft X-ray spectroscopy with high-energy resolution gives useful information of the chemical bonding states in compounds. Terauchi et al. recently reported a high-energy resolution of 0.2 eV in the Al-L emission spectrum using the previously developed soft X-ray Emission spectrometer (SXES) with a transmission electron microscope. This spectrometer can design to detect the energy from 60 to 1200 eV. In order to progress this result, we had attempted to enhance the detection energy range. Especially to detect the Li-K emission spectrum, we are developing a spectrometer with newly designed aberration corrected gratings. The newly developed grating JS50XL can cover the X-ray energy range from 50 to 200eV with the high energy resolution. It actually means to detect Li-K (55 eV), Al-L (70 eV), Si-L (100 eV), B-K (180 eV) and high order of C-K (279 eV), N-K (392 eV), O-K (525 eV) and so on. This SXES can be equipped not only with TEM, but also with EPMA. Moreover, we found out that attached EPMA with SXES has another strong feature that the X-ray intensity is in directly proportional to probe current. This feature is very useful for the trace element analysis. In the case of Li-K, Be-K and B-K emissions, the detection limits have been evaluated to be a few tens of ppm. For example trace boron analysis is expected to evaluate the newly developed materials quantitatively. This developed spectrometer is hopeful to observe chemical bonding state and trace element analysis in many kinds of fields. In this presentation we report the results for fundamental and actual samples. This development is conducting as one project of Collaborative Development of Innovative Seeds (Practicability verification stage) by Japan Science and Technology Agency.
Terauchi, Masami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
Microscopy and Microanalysis, 17(Suppl.2), p.604 - 605, 2011/07
We have been developing a soft X-ray emission spectroscopy (SXES) instrument for TEM. SXES combined with microscopy should be a hopeful method to reveal physical properties and chemical bonding states of identified small specimen areas of various compounds. Original SXES instruments for conventional transmission electron microscopes basically designed to detect from 60 eV to 1200 eV (or 2000 eV in extended version). For applying to material science, a much wider energy range is necessary. Thus, a new SXES development for electron microscope has started to obtain an energy range from 50 eV to 3800 eV. An extension in lower energy region was achieved by a new aberration corrected (varied-line-spaced: VLS) grating. Conventional gratings in soft-X-ray energy region have gold surface. Au has M-absorption edge at 2.2 keV and shows only a small reflectance higher than the energy. Thus, a new multilayer-coated (MLC) VLS grating has designed and manufactured for obtaining SXES spectra up to 4 keV at a grazing incident angle of 1.35 deg. This development is conducting as one project of Collaborative Development of Innovative Seeds (Practicability verification stage) by Japan Science and Technology Agency.
Terauchi, Masami*; Sato, Yohei*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; et al.
no journal, ,
no abstracts in English
Terauchi, Masami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
no journal, ,
Soft X-ray emission spectroscopy (SXES) combined with electron microscopy should be a hopeful method to reveal physical properties and chemical-bonding states of identified small specimen areas of various compounds. A new SXES development for electron microscopes (TEM and electron-probe microanalyzer) has started to obtain an energy range from 50 eV to 4000 eV by using four aberration-corrected (varied-line-spaced: VLS) gratings. An extension in lower energy region was achieved by a design and manufacturing a new VLS grating with a groove density of 1200 l/mm at a grazing incident angle of 4 deg. This grating enables us to detect Li-K emission (54 eV) with an energy resolution of 0.3 eV. A new multilayer-coated (MLC) VLS grating with a groove density of 2400 l/mm has designed and manufactured for obtaining SXES spectra up to 4 keV at a grazing incident angle of 1.35 deg. The material pair of the multilayer is W and BC. This new MLC-VLS grating can measure not only Te-L (3769eV) and L (4030 eV) but also four small structures of Ll, L
, L
and L
. At the same setting, Al-K (1486 eV), Pt-M (2050 eV), Pd-M (2839 eV), In-L (3287 eV) were also observed. This confirms that this newly designed MCL grating works for 1.5-4 keV.
Terauchi, Masami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
no journal, ,
We have developed a TEM-WDS instrument based on diffraction-gratings (covering 60-1200 eV by 2 gratings). Current our subjects are the extension of the energy range to 50-3800 eV which allows us to apply to the analysis of more wide range of materials, the application to EPMA, and the development of analysis software. Regarding to the extension to the high energy region for the purpose of the analysis of Te and Se which are used in memory devices, etc. we report this time the fabrication of a wide-band grating (1.5-4 keV) having a new multilayer structure and the measurement results obtained by a TEM with the grating. As a test of resolution and sensitivity In-L1(3487 eV) and Sn-L(3444 eV) peaks are clearly resolved at the measurement of ITO (a few % tin oxide added indium oxide compound) which is used as transparent electrodes.
Imazono, Takashi; Koike, Masato; Kawachi, Tetsuya; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; Yonezawa, Zeno*; Kuramoto, Satoshi*; et al.
no journal, ,
no abstracts in English
Imazono, Takashi; Koike, Masato; Kawachi, Tetsuya; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; Yonezawa, Zeno*; Kuramoto, Satoshi*; et al.
no journal, ,
no abstracts in English
Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Terauchi, Masami*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
no journal, ,
In order to detect ultra-soft X-ray emission from 50 to 200 eV, the newly designed a laminar-type varied-line-spaced grating (JS50XL) and spectrometer have been developed and attached to an electron probe microanalyser. We demonstrate Mg-L emission (50 eV) of metal Mg, Li-K emission (54 eV) for Li compounds such as Li battery. Moreover we evaluated the capability of detection limit few tenth ppm for trace B in a compound using calibration curve method.
