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Hu, W.*; Hayashi, Koichi*; Fukumura, Tomoteru*; Akagi, Kazuto*; Tsukada, Masaru*; Happo, Naohisa*; Hosokawa, Shinya*; Owada, Kenji; Takahashi, Masamitsu; Suzuki, Motohiro*; et al.
Applied Physics Letters, 106(22), p.222403_1 - 222403_5, 2015/06
Times Cited Count:39 Percentile:81.57(Physics, Applied)Kim, J.*; Sinha, J.*; Mitani, Seiji*; Hayashi, Masamitsu*; Takahashi, Saburo*; Maekawa, Sadamichi; Yamanouchi, Michihiko*; Ohno, Hideo*
Physical Review B, 89(17), p.174424_1 - 174424_8, 2014/05
Times Cited Count:91 Percentile:94.02(Materials Science, Multidisciplinary)We have studied the underlayer thickness and temperature dependencies of the current-induced effective field in CoFeB/MgO heterostructures with Ta-based underlayers. The underlayer thickness at which the effective field saturates is found to be different between the two orthogonal components of the effective field; i.e., the dampinglike term tends to saturate at a smaller underlayer thickness than the fieldlike term. For large underlayer thickness films in which the effective field saturates, we find that the measurement temperature significantly influences the size of the effective field. A striking difference is found in the temperature dependence of the two components: the dampinglike term decreases whereas the fieldlike term increases with increasing temperature. Using a simple spin diffusion-spin transfer model, we find that all of these results can be accounted for provided the real and imaginary parts of an effective spin mixing conductance are negative. These results imply that either spin transport in this system is different from conventional metallic interfaces or effects other than spin diffusion into the magnetic layer need to be taken into account in order to model the system accurately.
Hu, W.*; Hayashi, Koichi*; Owada, Kenji; Chen, J.*; Happo, Naohisa*; Hosokawa, Shinya*; Takahashi, Masamitsu; Bokov, A.*; Ye, Z.-G*
Physical Review B, 89(14), p.140103_1 - 140103_5, 2014/04
Times Cited Count:48 Percentile:85.62(Materials Science, Multidisciplinary)Hayashi, Masamitsu*; Ieda, Junichi; Yamane, Yuta; Oe, Junichiro*; Takahashi, Yukiko*; Mitani, Seiji*; Maekawa, Sadamichi
Physical Review Letters, 108(14), p.147202_1 - 147202_5, 2012/04
Times Cited Count:37 Percentile:82.18(Physics, Multidisciplinary)Spinmotive force associated with a moving domain wall is observed directly in permalloy nanowires using real time voltage measurements with proper subtraction of the electromotive force. Whereas the wall velocity exhibits nonlinear dependence on a magnetic field, the generated voltage increases linearly with the field. We show that the sign of the voltage reverses when the wall propagation direction is altered. Numerical simulations explain quantitatively these features of spinmotive force and indicate that the spinmotive force scales with the field even in a field range where the wall motion is no longer associated with periodic structure transformation.
Inagaki, Yoshiyuki; Hayashi, Koji; Kato, Michio; Fujisaki, Katsuo; Aita, Hideki; Takeda, Tetsuaki; Nishihara, Tetsuo; Inaba, Yoshitomo; Ohashi, Hirofumi; Katanishi, Shoji; et al.
JAERI-Tech 2003-034, 129 Pages, 2003/05
no abstracts in English
Shimizu, Akira; Kato, Michio; Hayashi, Koji; Fujisaki, Katsuo; Aita, Hideki; Takeda, Tetsuaki; Nishihara, Tetsuo; Katanishi, Shoji; Takada, Shoji; Inaba, Yoshitomo; et al.
JAERI-Tech 2003-033, 105 Pages, 2003/03
no abstracts in English
Takahashi, Masamitsu; Hayashi, Yukio; Mizuki, Junichiro; Tamura, Kazuhisa*; Kondo, Toshihiro*; Naohara, Hideo*; Uosaki, Kohei*
Surface Science, 461(1-3), p.213 - 218, 2000/08
Times Cited Count:71 Percentile:91.97(Chemistry, Physical)no abstracts in English
Hu, W.; Hayashi, Koichi*; Happo, Naohisa*; Hosokawa, Shinya*; Terai, Tomoyuki*; Fukuda, Takashi*; Kakeshita, Tomoyuki*; Takahashi, Masamitsu
no journal, ,
Hu, W.; Hayashi, Koichi*; Happo, Naohisa*; Owada, Kenji; Chen, J.*; Ye, Z.-G*; Hosokawa, Shinya*; Takahashi, Masamitsu
no journal, ,
Hu, W.; Hayashi, Koichi*; Happo, Naohisa*; Terai, Tomoyuki*; Fukuda, Takashi*; Kakeshita, Tomoyuki*; Takahashi, Masamitsu
no journal, ,
Hu, W.; Hayashi, Koichi*; Happo, Naohisa*; Owada, Kenji; Chen, J.*; Ye, Z.-G*; Hosokawa, Shinya*; Takahashi, Masamitsu
no journal, ,
Hu, W.; Hayashi, Koichi*; Happo, Naohisa*; Owada, Kenji; Chen, J.*; Ye, Z.-G*; Hosokawa, Shinya*; Takahashi, Masamitsu
no journal, ,