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Journal Articles

Evaluation of dependence of current decay time on electron temperature measured by He I line intensity ratios in JT-60U tokamak

Okamoto, Masaaki*; Hiraishi, Takehiro*; Ono, Noriyasu*; Takamura, Shuichi*; Nakano, Tomohide; Kawano, Yasunori; Ozeki, Takahisa; Sugihara, Masayoshi

Europhysics Conference Abstracts (CD-ROM), 31F, 4 Pages, 2007/00

It is of importance to evaluate the decay time of the plasma current for estimation of the electromagnetic force acting on the vacuum vessel during plasma disruptions in tokamak devices. The L/R model predicts that the decay time is proportional to three-haves power of the electron temperature, indicating the importance of the electron temperature for the estimation. However, it is difficult to measure the electron temperature of the disruptive plasma with the Langmuir probe due to the heat flux and due to the significant electromagnetic force. We propose a measurement technique of the electron temperature by using temperature-sensitive He I lines with high time resolution. In this method, the incident light to a spectrometer is divided into three, each of which transmits a bandpass filter, and then is measured with an absolutely calibrated photo-multiplier. The measured intensity ratios are analyzed with a collisional-radiative model. It is confirmed that the electron temperature determined by this technique is in agreement with that measured by a Langmuir probe in some devices. In the present work, the temporal evolution of the electron temperature during the disruptive plasma of JT-60U is measured with this technique.

Oral presentation

Experimental investigation of electron density and temperature measurement Using helium line intensity ratios in divertor simulator NAGDIS-II

Kajita, Shin*; Ono, Noriyasu*; Hiraishi, Takehiro*; Nakano, Tomohide; Takamura, Shuichi*

no journal, , 

no abstracts in English

Oral presentation

Measurement of electron temperature and density using He I line intensity ratio in tokamak plasmas

Hiraishi, Takehiro*; Okamoto, Masaaki*; Kajita, Shin*; Hasebe, Yu*; Ono, Noriyasu*; Takamura, Shuichi*; Nakano, Tomohide

no journal, , 

no abstracts in English

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