Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Nishimura, Akihiko; Takenaka, Yusuke*; Furusawa, Akinori; Torimoto, Kazuhiro; Ueda, Masashi; Fukuda, Naoaki*; Hirao, Kazuyuki*
E-Journal of Advanced Maintenance (Internet), 9(2), p.52 - 59, 2017/08
no abstracts in English
Makino, Takahiro; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Kobayashi, Daisuke*; Ikeda, Hirokazu*; Hirose, Kazuyuki*
Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.169 - 172, 2010/10
Digital Single Event Transient (DSET) pulse-widths in an inverter cell fabricated with the 0.2 mm FD-SOI process were estimated from high-energy heavy-ion-induced transient current in a single n-type MOSFET fabricated with the 0.2 mm FD-SOI process. We verified that the estimation method is applicable to the DSET pulse-widths estimation in the case of high-energy heavy-ion irradiation.
Makino, Takahiro; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi
IEEE Transactions on Nuclear Science, 56(6), p.3180 - 3184, 2009/12
Times Cited Count：13 Percentile：64.74(Engineering, Electrical & Electronic)SET-induced soft-error rates (
s) of logic LSIs are estimated from SET pulse-widths measured in logic cells used in logic LSIs. The estimated rates are consistent with directly measured s for logic LSIs.
Makino, Takahiro; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Kobayashi, Daisuke*; Hirose, Kazuyuki*
Proceedings of the 28th Symposium on Materials Science and Engineering, Research Center of Ion Beam Technology Hosei University, p.35 - 40, 2009/12
We want to reveal the relation between SET-induced soft-error rates (s) and SET pulse-width distribution to be able to reduce the with an SET filter like an RC filter or a temporal latch architecture. By considering the relation between 
and SET pulse-width, we can determine the minimum time constant for the SET filter to reduce the effectively. A theoretical estimation has been proposed to obtain in a logic LSI from SET pulse-widths measured in logic cells and the latch probability of SET pulses at flip-flops (FFs) used in logic LSIs. However, the estimation method has not been verified yet. In this paper, we verify the theoretical estimation method.
Makino, Takahiro*; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Yanagawa, Yoshimitsu*; Saito, Hirobumi*; Ikeda, Hirokazu*; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Onoda, Shinobu; et al.
IEEE Transactions on Nuclear Science, 56(1), p.202 - 207, 2009/02
Times Cited Count：36 Percentile：90.64(Engineering, Electrical & Electronic)SET pulse-widths were measured as a function of LET by using pulse capture circuits and were simulated with mixed-mode 3-D device simulations. We found that the carrier recombination process dominates LET dependence of SET pulse-widths.
Makino, Takahiro*; Yanagawa, Yoshimitsu*; Kobayashi, Daisuke*; Fukuda, Seisuke*; Hirose, Kazuyuki*; Ikeda, Hirokazu*; Saito, Hirobumi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; et al.
Shingaku Giho, 108(100), p.67 - 72, 2008/06
SET pulse-widths were measured as a function of LET by using pulse capture circuits. In addition, a scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI system.
Makino, Takahiro*; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Yanagawa, Yoshimitsu*; Saito, Hirobumi*; Ikeda, Hirokazu*; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Onoda, Shinobu; et al.
no journal, ,
no abstracts in English
Kobayashi, Daisuke*; Hirose, Kazuyuki*; Makino, Takahiro; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi
no journal, ,
no abstracts in English
Makino, Takahiro; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Kobayashi, Daisuke*; Ikeda, Hirokazu*; Hirose, Kazuyuki*
no journal, ,
no abstracts in English
Makino, Takahiro; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi; Hirose, Kazuyuki*
no journal, ,
no abstracts in English
Makino, Takahiro; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Kobayashi, Daisuke*; Ikeda, Hirokazu*; Hirose, Kazuyuki*
no journal, ,
no abstracts in English
