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JAEA Reports

Annual report on the environmental radiation monitoring around the Tokai Reprocessing Plant FY2020

Nakada, Akira; Nakano, Masanao; Kanai, Katsuta; Seya, Natsumi; Nishimura, Shusaku; Nemoto, Masashi; Tobita, Keiji; Futagawa, Kazuo; Yamada, Ryohei; Uchiyama, Rei; et al.

JAEA-Review 2021-062, 163 Pages, 2022/02

JAEA-Review-2021-062.pdf:2.87MB

Environmental radiation monitoring around the Tokai Reprocessing Plant has been performed by the Nuclear Fuel Cycle Engineering Laboratories, based on "Safety Regulations for the Reprocessing Plant of Japan Atomic Energy Agency, Chapter IV - Environmental Monitoring". This annual report presents the results of the environmental monitoring and the dose estimation to the hypothetical inhabitant due to the radioactivity discharged from the plant to the atmosphere and the sea during April 2020 to March 2021. In this report, some data include the influence of the accidental release from the Fukushima Daiichi Nuclear Power Station of Tokyo Electric Power Co., Inc. (the trade name was changed to Tokyo Electric Power Company Holdings, Inc. on April 1, 2016) in March 2011. Appendices present comprehensive information, such as monitoring programs, monitoring methods, monitoring results and their trends, meteorological data and discharged radioactive wastes. In addition, the data which were influenced by the accidental release and exceeded the normal range of fluctuation in the monitoring, were evaluated.

Journal Articles

The Degradation of the electrical properties of IGBTs by 2-MeV electron irradiation at high-temperatures

Nakabayashi, Masakazu*; Oyama, Hidenori*; Hanano, N.*; Hirao, Toshio; Simoen, E.*; Claeys, C.*

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.183 - 186, 2004/10

no abstracts in English

Journal Articles

Radiation damages of InGaAs photodiodes by high-temperature electron irradiation

Oyama, Hidenori*; Takakura, Kenichiro*; Nakabayashi, Masakazu*; Hirao, Toshio; Onoda, Shinobu; Kamiya, Tomihiro; Simoen, E.*; Claeys, C.*; Kuboyama, Satoshi*; Oka, Katsumi*; et al.

Nuclear Instruments and Methods in Physics Research B, 219-220, p.718 - 721, 2004/06

 Times Cited Count:3 Percentile:25.51(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Induced lattice defects in InGaAs laser diodes by high-temperature $$gamma$$-ray irradiation

Oyama, Hidenori*; Hirao, Toshio; Simoen, E.*; Claeys, C.*; Onoda, Shinobu; Takami, Yasukiyo*; Ito, Hisayoshi

Physica B; Condensed Matter, 308-310, p.1185 - 1188, 2001/12

 Times Cited Count:8 Percentile:45.62(Physics, Condensed Matter)

no abstracts in English

Journal Articles

Impact of lattice defects on the preformance degradation of Si photodiodes by high-temperature $$gamma$$ and electron irradiation

Oyama, Hidenori*; Hirao, Toshio; Simoen, E.*; Claeys, C.*; Onoda, Shinobu*; Takami, Yasukiyo*; Ito, Hisayoshi

Physica B; Condensed Matter, 308-310, p.1226 - 1229, 2001/12

 Times Cited Count:29 Percentile:78.91(Physics, Condensed Matter)

no abstracts in English

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