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Xu, X.*; Odaira, Takumi*; Xu, S.*; Hirata, Kenji*; Omori, Toshihiro*; Ueki, Kosuke*; Ueda, Kyosuke*; Narushima, Takayuki*; Nagasako, Makoto*; Kainuma, Ryosuke*; et al.
Advanced Materials & Processes, 180(7), p.35 - 37, 2022/10
Odaira, Takumi*; Xu, S.*; Hirata, Kenji*; Xu, X.*; Omori, Toshihiro*; Ueki, Kosuke*; Ueda, Kyosuke*; Narushima, Takayuki*; Nagasako, Makoto*; Harjo, S.; et al.
Advanced Materials, 34(27), p.2202305_1 - 2202305_11, 2022/07
Times Cited Count:24 Percentile:89.98(Chemistry, Multidisciplinary)Nakajima, Kaoru*; Nagano, Kengo*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Hirata, Koichi*; Kimura, Kenji*
Applied Physics Letters, 104(11), p.114103_1 - 114103_4, 2014/03
Times Cited Count:7 Percentile:29.34(Physics, Applied)Hirata, Yasuyuki*; Kojima, Kenji*; Uchida, Shinichi*; Ishikado, Motoyuki; Iyo, Akira*; Eisaki, Hiroshi*; Tajima, Setsuko*
Physica C, 470(Suppl.1), p.S44 - S46, 2010/12
Times Cited Count:2 Percentile:11.37(Physics, Applied)Infrared reflectivity spectra of the multilayered HgBaCa
Cu
O
(
= 2, 3, 4, and 5) are measured. Optical plasma modes associated with the Josephson coupling between CuO
planes within a multilayer appear below
in the c-axis component of the reflectivity spectrum. For the bilayer and trilayer compound an optical Josephson plasma mode appears at unprecedentedly high frequency,
700-800 cm
, below
. The plasma frequencies appreciably decrease in four- and five-layer compounds which indicates the suppression of superconducting order in the inner CuO
planes, consistent with the result of NMR experiment.
Ferdows, M.; Suzuya, Kentaro; Kawakita, Yukinobu; Kohara, Shinji*; Kodama, Katsuaki; Yamamoto, Kazunori; Shamoto, Shinichi; Hirata, Takamichi*; Omote, Kenji*; Kasama, Yasuhiko*; et al.
Abstracts of 7th International Symposium on Advanced Materials in Asia-Pacific (NT 2010)/JAIST International Symposium on Nano Technology 2010 (7th ISAMAP), p.25 - 28, 2010/09
We performed Reverse Monte Carlo analysis (RMCA) to study amorphous structure of a heterofullerene, CN by using pulsed neutron powder diffraction data. The scattering function S(Q) shows that the structure is amorphous, while the atomic pair distribution function (PDF) shows that the local structure is similar to that of C
. Obtained structures strongly depend on the initial models. Problems for this RMCA method are discussed.
Matsuo, Yoji*; Mori, Shigeo*; Hirata, Akihiko*; Yoshii, Kenji; Ikeda, Naoshi*
Journal of Physics; Conference Series, 200, p.012128_1 - 012128_4, 2010/02
Times Cited Count:3 Percentile:73.13(Materials Science, Multidisciplinary)RFeO
(R= Ho-Lu,Y) is a novel ferroelectric material in which ferroelectric polarization is caused by the charge ordering (CO) of Fe
and Fe
. In this work we investigated the CO structure and dielectric/magnetic properties in RFe
O
and RFeCuO
(R=Lu,Yb, M=Cu,Co) by a transmission electron microscopy (TEM), combining with dielectric and magnetic measurements. LuFeCuO
is a dielectric compound, which shows the characteristic low-frequency dielectric dispersion. In addition, the Cu
substitution in LuFe
O
suppressed the formation of the CO structure and induced characteristic polar nanodomains with the 5-10nm size. Magnetic measurement revealed that LuFeCuO
shows the magnetic transition around 50K, which is much lower than the magnetictransition temperature of 250K in LuFe
O
. Our experimental results suggest that the polar nanodomains should be responsible for the magnetic/dielectric properties in RFeMO
.
Matsuo, Yoji*; Hirata, Akihiko*; Horibe, Yoichi*; Yoshii, Kenji; Ikeda, Naoshi*; Mori, Shigeo*
Ferroelectrics, 380(1), p.56 - 62, 2009/06
Times Cited Count:6 Percentile:28.47(Materials Science, Multidisciplinary)Diluted effect on the charge ordered (CO) structure in dielectric materials LuFeO
(
=Cu, Co) were investigated by an energy-filtered transmission electron microscope (TEM), in combination with a conventional TEM. It is revealed that partial substitution of Cu
and Co
for Fe
in LuFe
O
destabilized the CO structure. In LuFeCuO
, there exist characteristic zigzag-shaped diffuse streaks and diffuse spots at the h/3-
h/3-
0-type positions (h: integer,
=0.06) in reciprocal space, which originate from static cationic ordering of Fe
and Cu
ions in the triangular lattice. Moreover, real-space images by the energy-filtered TEM revealed that nanometer-sized domain structures with the 5
10 nm size are formed. In contrast, honeycomb-shaped diffuse streaks were found in LuFeCoO
, in which no domain structures are observed in real-space images.
Horiguchi, Kenichi; Sugaya, Atsushi; Saito, Yasuo; Tanaka, Kenji; Akutsu, Shigeru; Hirata, Toshiaki
Proceedings of 2009 International Congress on Advances in Nuclear Power Plants (ICAPP '09) (CD-ROM), p.9411_1 - 9411_9, 2009/05
The low-level radioactive Waste treatment Facility (LWTF) was constructed at the Tokai Reprocessing Plant (TRP) and cold test has been carried out since 2006. The waste which is treated in the LWTF is combustible/incombustible solid waste and liquid waste. In the LWTF, The combustible/incombustible solid waste will be incinerated. The liquid waste will be treated by the radio-nuclides removal process subsequently solidified by cement materials. This report describes the essential technologies of the LWTF and results of R&D work for the nitrate-ion decomposition technology for the liquid waste.
Shibano, Junichi*; Shobu, Takahisa; Suzuki, Kenji*; Hirata, Tomoyuki*; Kaneko, Hiroshi; Kobayashi, Michiaki*
Zairyo, 56(10), p.985 - 992, 2007/10
This paper presents a basic research on a measurement of strain in the bulk of materials by using high energy white X-rays from a synchrotron radiation source of SPring-8. WEL-TEN780E (JIS G3128 SHY685) whose grain size was 0.013 mm was used as a specimen. The specimen was loaded with four point bending. The white X-ray beam, which has a height of 0.05 mm and width of 0.03 mm, was incident in it. Bending strain at the surface of specimen was measured by a strain gauge. The internal strain of SHY685 of 5 mm thickness could be evaluated using white X-rays which range of energy from 60 keV to 150 keV. Furthermore, the measurement error of strain could be decreased by using the diffracted X-rays with high energy, high peak count and the profile which is close to Gaussian curve. The results showed that the high energy white X-ray is effective for internal strain measurements.
Shobu, Takahisa; Kaneko, Hiroshi; Mizuki, Junichiro; Konishi, Hiroyuki; Shibano, Junichi*; Hirata, Tomoyuki*; Suzuki, Kenji*
AIP Conference Proceedings 879, p.1581 - 1585, 2007/01
The third generation synchrotron X-ray source such as SPring-8 provides us intense beams of high energy X-rays. The techniques of non-destructive internal residual stress measurement for industrial applications are well established by angle dispersive diffractometry with high energy synchrotron radiation and provide valuable information. The energy dispersive diffraction techniques using white radiation is the advantage of a stress measurement compared with the angular dispersive one. For example, the multitudes of reflections recorded in one spectrum offers additional information that can be used for stress gradient evaluation. The purpose of present study is to apply high energy white X-rays to the measurement of the residual strain in the bulk specimen. The experiment was carried out on the beamline BL14B1 at SPring-8. A diffraction pattern was collected by a Ge Solid State Detector (SSD) mounted on the arm of a 2-axes diffractometer behind two sets of secondary collimating slits. The beam size of white X-rays was 0.05 0.3 mm
. The specimens were JIS-S45C carbon steel and JIS-SUS304 austenitic stainless steel with a thickness of 5mm. The bending stress was applied with the four-point bending and the strain at the surface of the specimen was measured by a strain gauge as shown in the figure. X-rays diffraction measurement was carried out simultaneously. The figure shows each diffraction profile of SUS304 taken with white X-rays. The strain was calculated by the ratio of the energy shift to the peak energy. Though many peaks appeared in every measured positions Y, each diffraction pattern depended on the number and the orientation of crystal grains in irradiated volume by X-rays. The calculated strain by using a single peak is depending on peak quality. The accurate internal stress can be obtained with white X-rays by selecting the peak at high energy, high peak counts and close to Gaussian peak profile.
Enoeda, Mikio; D.F.Holland*; Matsuda, Yuji; Ohira, Shigeru; Okuno, Kenji; ; Hirata, Shingo*
JAERI-Tech 95-050, 90 Pages, 1995/11
no abstracts in English
Hirata, Shingo*; Kakuta, Toshiya*; Ito, H.*; Suzuki, T.*; Hayashi, Takumi; Ishida, Toshikatsu*; Matsuda, Yuji; Okuno, Kenji
Fusion Technology, 28(3), p.1521 - 1526, 1995/10
no abstracts in English
Hayashi, Takumi; Konishi, Satoshi; Ohira, Shigeru; Nakamura, Hirofumi; Inoue, Masahiko*; Watanabe, Tetsuo*; Hirata, Kazuhiro*; Naruse, Yuji; Okuno, Kenji; Barnes, J. W.*; et al.
JAERI-M 93-094, 54 Pages, 1993/03
no abstracts in English
Hayashi, Takumi; Konishi, Satoshi; Nakamura, Hirofumi; Inoue, Masahiko*; Hirata, Kazuhiro*; Okuno, Kenji; Naruse, Yuji; Barnes, J. W.*; W.Harbin*; Anderson, J. L.*; et al.
JAERI-M 93-084, 32 Pages, 1993/03
no abstracts in English
Hayashi, Takumi; Nakamura, Hirofumi; Konishi, Satoshi; Inoue, Masahiko*; Hirata, Kazuhiro*; Okuno, Kenji; Naruse, Yuji; Anderson, J. L.*; Sherman, R. H.*; Willms, R. S.*; et al.
JAERI-M 93-083, 54 Pages, 1993/03
no abstracts in English
Hayashi, Takumi; Nakamura, Hirofumi; Konishi, Satoshi; Inoue, Masahiko*; Hirata, Kazuhiro*; Okuno, Kenji; Naruse, Yuji; Barnes, J. W.*; W.Harbin*; Bartlit, J. R.*; et al.
JAERI-M 93-082, 32 Pages, 1993/03
no abstracts in English
Hayashi, Takumi; Nakamura, Hirofumi; Konishi, Satoshi; Yamanishi, Toshihiko; Inoue, Masahiko*; Hirata, Kazuhiro*; Okuno, Kenji; Naruse, Yuji; Anderson, J. L.*; Barnes, J. W.*; et al.
JAERI-M 93-081, 35 Pages, 1993/03
no abstracts in English
Konishi, Satoshi; Hayashi, Takumi; Inoue, Masahiko*; Hirata, Kazuhiro*; Okuno, Kenji; Naruse, Yuji; Barnes, J. W.*; W.Harbin*; Bartlit, J. R.*; Anderson, J. L.*
JAERI-M 93-080, 29 Pages, 1993/03
no abstracts in English
Hirata, Kazuhiro*; Matsumoto, A.*; Yamanishi, Toshihiko; Okuno, Kenji; Naruse, Yuji; Yamamoto, Ichiro*
Fusion Technology, 21(2P2), p.937 - 941, 1992/03
Times Cited Count:26 Percentile:88.65(Nuclear Science & Technology)no abstracts in English
Nakamura, Takuya; Hirata, Kazuhiro*; Yamanishi, Toshihiko; Okuno, Kenji; Naruse, Yuji
Fusion Technology, 21(2P2), p.942 - 947, 1992/03
Times Cited Count:2 Percentile:27.22(Nuclear Science & Technology)no abstracts in English