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Journal Articles

Transmission secondary ion mass spectrometry using 5 MeV C$$_{60}$$$$^{+}$$ ions

Nakajima, Kaoru*; Nagano, Kengo*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Hirata, Koichi*; Kimura, Kenji*

Applied Physics Letters, 104(11), p.114103_1 - 114103_4, 2014/03

https://doi.org/10.1063/1.4868655
 Times Cited Count：6 Percentile：28.11(Physics, Applied)

Journal Articles

Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Narumi, Kazumasa

Nuclear Instruments and Methods in Physics Research B, 314, p.39 - 42, 2013/11

https://doi.org/10.1016/j.nimb.2013.05.045
 Times Cited Count：4 Percentile：34.1(Instruments & Instrumentation)

Journal Articles

Transmission properties of C$$_{60}$$ ions through micro- and nano-capillaries

Tsuchida, Hidetsugu*; Majima, Takuya*; Tomita, Shigeo*; Sasa, Kimikazu*; Narumi, Kazumasa; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Hirata, Koichi*; Shibata, Hiromi*; et al.

Nuclear Instruments and Methods in Physics Research B, 315, p.336 - 340, 2013/11

https://doi.org/10.1016/j.nimb.2013.04.094
 Times Cited Count：3 Percentile：27.62(Instruments & Instrumentation)

Journal Articles

Reduction of charging effects on negative secondary ion TOF mass spectra of PMMA using cluster ion impacts

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Narumi, Kazumasa; Kamiya, Tomihiro

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 165, 2013/01

https://doi.org/10.11484/jaea-review-2012-046

Journal Articles

Secondary ion emission from PTFE upon C$$_{60}$$ ion impacts

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Takahashi, Yasuyuki*; Narumi, Kazumasa; Kamiya, Tomihiro

JAEA-Review 2011-043, JAEA Takasaki Annual Report 2010, P. 156, 2012/01

https://doi.org/10.11484/jaea-review-2011-043

Journal Articles

Surface-sensitive chemical analysis of organic insulating thin films using negative secondary ions induced by medium energy C$$_{60}$$ impacts

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Narumi, Kazumasa

Applied Physics Express, 4(11), p.116202_1 - 116202_3, 2011/11

https://doi.org/10.1143/APEX.4.116202
 Times Cited Count：8 Percentile：35.59(Physics, Applied)

Journal Articles

Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Takahashi, Yasuyuki*; Narumi, Kazumasa

Review of Scientific Instruments, 82(3), p.033101_1 - 033101_5, 2011/03

https://doi.org/10.1063/1.3541799
 Times Cited Count：10 Percentile：46(Instruments & Instrumentation)

Journal Articles

Comparison of secondary ion emission yields for poly-tyrosine between cluster and heavy ion impacts

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Takahashi, Yasuyuki; Narumi, Kazumasa

Nuclear Instruments and Methods in Physics Research B, 268(19), p.2930 - 2932, 2010/10

https://doi.org/10.1016/j.nimb.2010.05.011
 Times Cited Count：3 Percentile：29.26(Instruments & Instrumentation)

Journal Articles

Development of secondary ion mass spectroscopy using medium energy C$$_{60}$$ ion impact

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Adachi, Masahiro*; Yamada, Keisuke; Narumi, Kazumasa

Nuclear Instruments and Methods in Physics Research B, 266(10), p.2450 - 2452, 2008/05

https://doi.org/10.1016/j.nimb.2008.03.019
 Times Cited Count：13 Percentile：65.61(Instruments & Instrumentation)

Journal Articles

Organic contaminant detection of silicon wafers using negative secondary ions induced by cluster ion impacts

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Narumi, Kazumasa

Applied Physics Express, 1(4), p.047002_1 - 047002_3, 2008/04

https://doi.org/10.1143/APEX.1.047002
 Times Cited Count：4 Percentile：19.18(Physics, Applied)

Journal Articles

Laser ablation of silicon in neon gas; Study of excitation mechanism of neon neutrals by ablated silicon ions

Saeki, Morihisa; Hirata, Koichi*; Sakka, Tetsuo*; Oba, Hironori; Yokoyama, Atsushi

Journal of Applied Physics, 98(4), p.044912_1 - 044912_6, 2005/08

https://doi.org/10.1063/1.2008387
 Times Cited Count：3 Percentile：13.94(Physics, Applied)

no abstracts in English

Journal Articles

Effect of arbuscular mycorrhizal fungus on growth and P absorption of soybean

Watanabe, Koichiro*; Rokuhira, Kazuyoshi*; Matsuda, Hiroko*; Arima, Yasuhiro*; Hirata, Hiroshi*; Kume, Tamikazu; Matsuhashi, Shimpei

Nihon Dojo Hiryo Gaku Zasshi, 72(6), p.793 - 796, 2001/12

http://ci.nii.ac.jp/naid/110001748076

no abstracts in English

Journal Articles

Defects in 30 keV Er$$^{+}$$-implanted SiO$$_{2}$$/Si studied by positron annihilation and cathodoluminescence

Hirata, Koichi*; Arai, Hideyuki*; Kawasuso, Atsuo; Sekiguchi, T.*; Kobayashi, Yoshinori*; Okada, Sohei

Journal of Applied Physics, 90(1), p.237 - 242, 2001/07

https://doi.org/10.1063/1.1371948
 Times Cited Count：4 Percentile：22.07(Physics, Applied)

no abstracts in English

Journal Articles

Effect of MeV energy cluster ion irradiation

Saito, Yuichi; Mizuhashi, Kiyoshi; Tajima, Satoshi; Arakawa, Kazuo; Hirata, Koichi*; Kobayashi, Yoshinori*

JAERI-Conf 2000-019, p.93 - 96, 2001/02

https://jopss.jaea.go.jp/pdfdata/JAERI-Conf-2000-019.pdf

no abstracts in English

JAEA Reports

Japanese contributions to blanket design for ITER

Kuroda, Toshimasa*; Yoshida, Hiroshi; Takatsu, Hideyuki; Seki, Yasushi; Noda, Kenji; Watanabe, H.; Koizumi, Koichi; Nishio, Satoshi; *; *; et al.

JAERI-M 91-133, 191 Pages, 1991/08

JAERI-M-91-133.pdf:5.79MB

no abstracts in English

Oral presentation

Application of cluster ion irradiation effects to high sensitive surface analysis

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Narumi, Kazumasa; Kobayashi, Yoshinori*; Fukuda, Mitsuhiro*

no journal, , 

no abstracts in English

Oral presentation

Highly sensitive TOF mass spectroscopy for contaminant analysis using pulsed cluster ion beam

Hirata, Koichi*; Kobayashi, Yoshinori*; Saito, Yuichi; Chiba, Atsuya; Adachi, Masahiro; Yamada, Keisuke; Kamiya, Tomihiro; Narumi, Kazumasa

no journal, , 

no abstracts in English

Oral presentation

Studies on radiation effect of MeV cluster ions at JAEA/Takasaki

Narumi, Kazumasa; Saito, Yuichi; Chiba, Atsuya; Adachi, Masahiro; Naramoto, Hiroshi*; Seki, Shu*; Hirata, Koichi*; Iwase, Akihiro*; Kaneko, Toshiaki*; Shibata, Hiromi*

no journal, , 

no abstracts in English

Oral presentation

Secondary ion emission from PTFE upon C$$_{60}$$ ion impacts

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Narumi, Kazumasa; Kamiya, Tomihiro

no journal, , 

no abstracts in English

Oral presentation

Comparison of secondary negative ion emission yields for organic thin films between C$$_{60}$$ cluster and monoatomic ion impacts

Hirata, Koichi*; Saito, Yuichi; Narumi, Kazumasa; Chiba, Atsuya; Yamada, Keisuke

no journal, , 

no abstracts in English

29 (Records 1-20 displayed on this page)