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論文

Thermally altered subsurface material of asteroid (162173) Ryugu

北里 宏平*; Milliken, R. E.*; 岩田 隆浩*; 安部 正真*; 大竹 真紀子*; 松浦 周二*; 高木 靖彦*; 中村 智樹*; 廣井 孝弘*; 松岡 萌*; et al.

Nature Astronomy (Internet), 5(3), p.246 - 250, 2021/03

 被引用回数:30 パーセンタイル:96.87(Astronomy & Astrophysics)

2019年4月「はやぶさ2」ミッションは、地球に近い炭素質の小惑星(162173)リュウグウの人工衝撃実験を成功させた。これは露出した地下物質を調査し、放射加熱の潜在的な影響をテストする機会を提供した。はやぶさ2の近赤外線分光器(NIRS3)によるリュウグウの地下物質の観測結果を報告する。発掘された材料の反射スペクトルは、表面で観測されたものと比較して、わずかに強くピークがシフトした水酸基(OH)の吸収を示す。これは、宇宙風化や放射加熱が最上部の表面で微妙なスペクトル変化を引き起こしたことを示している。ただし、このOH吸収の強度と形状は、表面と同様に、地下物質が300$$^{circ}$$Cを超える加熱を経験したことを示している。一方、熱物理モデリングでは、軌道長半径が0.344AUに減少しても、推定される掘削深度1mでは放射加熱によって温度が200$$^{circ}$$Cを超えて上昇しないことが示されている。これは、リュウグウ母天体が放射加熱と衝撃加熱のいずれか、もしくは両方により熱変化が発生したという仮説を裏付けている。

論文

The Surface composition of asteroid 162173 Ryugu from Hayabusa2 near-infrared spectroscopy

北里 宏平*; Milliken, R. E.*; 岩田 隆浩*; 安部 正真*; 大竹 真紀子*; 松浦 周二*; 荒井 武彦*; 仲内 悠祐*; 中村 智樹*; 松岡 萌*; et al.

Science, 364(6437), p.272 - 275, 2019/04

 被引用回数:233 パーセンタイル:99.74(Multidisciplinary Sciences)

小惑星探査機はやぶさ2のターゲット天体であるリュウグウは、始原的な炭素質物質で構成されていると考えられている。はやぶさ2に搭載された近赤外分光計(NIRS3)によって、天体の表面組成を得た。天体全体の観測で、弱く細い吸収が2.72ミクロンに確認され、OHを含む鉱物の存在を示している。弱いOH吸収と低いアルベドは熱やショックによって変質を受けた炭素質コンドライトに似ている。OHバンドの位置はほとんど一定であり、衝撃片の集合によって形成されたリュウグウは組成的に均質であることを示している。

論文

Transmission secondary ion mass spectrometry using 5 MeV C$$_{60}$$$$^{+}$$ ions

中嶋 薫*; 永野 賢悟*; 鈴木 基史*; 鳴海 一雅; 齋藤 勇一; 平田 浩一*; 木村 健二*

Applied Physics Letters, 104(11), p.114103_1 - 114103_4, 2014/03

 被引用回数:6 パーセンタイル:26.98(Physics, Applied)

In the secondary ion mass spectrometry (SIMS), use of cluster ions has an advantage of having a high sensitivity of intact large molecular ions over monatomic ions. This paper presents further yield enhancement of the intact biomolecular ions with measuring the secondary ions emitted from a self-supporting thin film in the forward direction, which is the same direction as primary beams. Phenylalanine amino-acid films deposited on self-supporting thin Si$$_{3}$$N$$_{4}$$ films were bombarded with 5-MeV C$$_{60}$$$$^{+}$$ ions. Secondary ions emitted in the forward and backward directions were measured under the bombardments of the SiN and phenylalanine sides, respectively. The yield of intact phenylalanine molecular ions emitted in the forward direction is about one order of magnitude larger than the backward direction, while fragment ions of phenylalanine molecules are suppressed. This suggests a large potential of transmission cluster-ion SIMS for the analysis of biological materials.

論文

Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 鳴海 一雅

Nuclear Instruments and Methods in Physics Research B, 314, p.39 - 42, 2013/11

 被引用回数:4 パーセンタイル:33.13(Instruments & Instrumentation)

Secondary ion mass spectrometry (SIMS) is one of the most powerful tools for surface analysis. Use of a time-of-flight (TOF) mass spectrometry for SIMS is advantageous in efficiently detecting secondary ions at a wider range of mass to charge ratio. We have studied on TOF-SIMS utilizing cluster ions as primary ions. Their Energy dependence to the yield of secondary ions from organic thin films was obtained in the energy range up to MeV order. As a result, it was revealed that the secondary-ion yields for organic material increased with increasing incident cluster energy in the range. This shows that cluster impacts with the energy range of up to MeV order are useful in TOF-SIMS to be applied to the high sensitive analysis of surface for organic materials.

論文

Transmission properties of C$$_{60}$$ ions through micro- and nano-capillaries

土田 秀次*; 間嶋 拓也*; 冨田 成夫*; 笹 公和*; 鳴海 一雅; 齋藤 勇一; 千葉 敦也; 山田 圭介; 平田 浩一*; 柴田 裕実*; et al.

Nuclear Instruments and Methods in Physics Research B, 315, p.336 - 340, 2013/11

 被引用回数:3 パーセンタイル:26.8(Instruments & Instrumentation)

Applying the beam-focusing method with capillaries to C$$_{60}$$ projectiles in the velocity range between 0.14 and 0.2 a.u., transmission properties of C$$_{60}$$ ions through two different types of capillaries are studied: (1) a borosilicate-glass single microcapillary with an outlet diameter of 5.5 $$mu$$m, and (2) an Al$$_{2}$$O$$_{3}$$ multicapillary foil with approximatey 70-nm pores in diameter and a high aspect ratio of approximately 750. Transmitted-particle compositions are measured with the electrostatic-deflection method combined with a two-dimensional position-sensitive detector. In the experiments with the single microcapillary, the main transmitted component is found to be primary C$$_{60}$$ ions, which are focused in the area equal to the capillary outlet diameter. The other components are charge-exchanged C$$_{60}$$ ions and charged or neutral fragments (fullerene-like C$$_{60-2m}$$ and small C$$_{n}$$ particles), and their fractions decrease with decreasing projectile velocity. Similar results are obtained in the experiments with the multicapillary foil. It is concluded from the relative transimission fractions of more than 80% that the C$$_{60}$$ transmission fraction is considerably high for both types of the capillaries in the present velocity range.

論文

Reduction of charging effects on negative secondary ion TOF mass spectra of PMMA using cluster ion impacts

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 鳴海 一雅; 神谷 富裕

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 165, 2013/01

Secondary ion (SI) mass spectrometry, based on the phenomenon that primary ion impacts on a target produce SIs originating from the target, is one of the most powerful tools for surface analysis. One of the difficulties in SI mass measurements of insulating targets is to stabilize the surface potential during the measurements, because ion impacts on insulating targets usually lead to an increase in the potential caused by the difference between the injected and emitted charges. We compared time-sequential variations of negative-SI TOF mass spectra of a thin PMMA film target for monoatomic (C$$_1$$$$^+$$) and cluster ions (C$$_8$$$$^+$$) impact with the same incident energy per atom (0.5 MeV/atom) to study difference in charging effects on N-SI mass spectra of insulating targets. For C$$_1$$$$^+$$ impacts, the peak shift to longer flight time and SI intensity reduction are observed. In contrast to the C$$_1$$$$^+$$ impacts, the N-SI TOF mass spectra for C$$_8$$$$^+$$ do not show the peak shift and SI intensity reduction, which shows that the surface potential is stable during the C$$_8$$$$^+$$ bombardment. The results demonstrate that N-SI TOF mass measurement of the insulating thin film target is available using cluster ions as a primary ion without charge compensation.

論文

Secondary ion emission from PTFE upon C$$_{60}$$ ion impacts

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 高橋 康之*; 鳴海 一雅; 神谷 富裕

JAEA-Review 2011-043, JAEA Takasaki Annual Report 2010, P. 156, 2012/01

Secondary ion (SI) yields from a Poly(tetrafluoroethylene) (PTFE) target for C$$_{60}$$ ion impacts were measured with an energy range from 30 keV to 270 keV by time-of-flight (TOF) SI mass analysis combined with SI electric current measurements. As a result, the use of impacts of C$$_{60}$$ ion with the increased incident energies (60 keV C$$_{60}$$$$^+$$, 120 keV C$$_{60}$$$$^+$$ and 270 keV C$$_{60}$$$$^{2+}$$) provided higher yields of the characteristic positive SIs for PTFE than those of lower energy C$$_{60}$$ ions (30-keV C$$_{60}$$$$^+$$) and advantageous for highly sensitive chemical analysis of PTFE.

論文

Surface-sensitive chemical analysis of organic insulating thin films using negative secondary ions induced by medium energy C$$_{60}$$ impacts

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 鳴海 一雅

Applied Physics Express, 4(11), p.116202_1 - 116202_3, 2011/11

 被引用回数:8 パーセンタイル:34.77(Physics, Applied)

We report on the surface-sensitive chemical analysis of organic insulating thin films using negative secondary ions (N-SIs) induced by C$$_{60}$$ impacts in the medium energy range from several tens to several hundreds keV. Incident C$$_{60}$$ energy dependence of emission yields of characteristic N-SIs for poly(methyl methacrylate) and charging effects on the N-SI mass spectra were investigated using time-of-flight SI mass spectrometry. Our results show that medium energy C$$_{60}$$ impacts stably provides considerably high characteristic N-SI yields without charge-compensation, and demonstrate that time-of-flight SI mass spectrometry with medium energy C$$_{60}$$ impacts is advantageous for highly-sensitive chemical analysis of organic insulators.

論文

Production and properties of transuranium elements

永目 諭一郎; 平田 勝

Radiochimica Acta, 99(7-8), p.377 - 393, 2011/08

 被引用回数:11 パーセンタイル:66.95(Chemistry, Inorganic & Nuclear)

We summarize historical perspective of the transuranium elements, neptunium (Np) through lawrencium (Lr), and recent progress on production, and nuclear and chemical properties of these elements. Exotic decay properties of heavy nuclei are also introduced. Chemical properties of transuranium elements in aqueous and solid states are summarized based on the actinide concept.

論文

Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 高橋 康之*; 鳴海 一雅

Review of Scientific Instruments, 82(3), p.033101_1 - 033101_5, 2011/03

 被引用回数:10 パーセンタイル:44.94(Instruments & Instrumentation)

We report suitable secondary ion (SI) counting for surface-sensitive chemical analysis of organic compounds using time-of-flight (TOF) SI mass spectroscopy, based on considerably higher emission yields of SIs induced by cluster ion impact ionization. A SI counting system for a TOF SI mass spectrometer was developed using a fast digital storage oscilloscope, which allows us to perform various types of analysis as all the signal pulses constituting TOF SI mass spectra can be recorded digitally in the system. Effects of the SI counting strategy on SI mass spectra were investigated for C$$_8$$ and C$$_{60}$$ cluster ion impacts on an organically contaminated silicon wafer and on polytetrafluoroethylene targets by comparing TOF SI mass spectra obtained from the same recorded signals with different SI counting procedures. Our results show that the use of a counting system, which can cope with high SI yields is necessary for quantitative analysis of SI mass spectra obtained under high SI yield per impact conditions, including the case of cluster ion impacts on organic compounds.

論文

Production and chemistry of transuranium elements

永目 諭一郎; 平田 勝; 中原 弘道*

Handbook of Nuclear Chemistry, p.817 - 875, 2011/02

This chapter reviews historical perspective of transuranium elements and recent progress on production and studying nuclear properties of transuranium nuclei. Exotic decay properties of heavy nuclei are also introduced. Chemical properties of transuranium elements in aqueous and solid states are summarized based on the actinide concept. For new application of studying transuranium, an X-ray absorption fine structure (XAFS) method and computational chemistry are surveyed.

論文

Comparison of secondary ion emission yields for poly-tyrosine between cluster and heavy ion impacts

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 高橋 康之; 鳴海 一雅

Nuclear Instruments and Methods in Physics Research B, 268(19), p.2930 - 2932, 2010/10

 被引用回数:3 パーセンタイル:28.87(Instruments & Instrumentation)

Emission yields of secondary ions necessary for the identification of poly-tyrosine were compared for incident ion impacts of energetic cluster ions (0.8 MeV C$$_{8}$$$$^{+}$$, 2.4 MeV C$$_{8}$$$$^{+}$$, and 4.0 MeV C$$_{8}$$$$^{+}$$) and swift heavy monoatomic molybdenum ions (4.0 MeV Mo$$^{+}$$ and 14 MeV Mo$$^{4+}$$) with similar mass to that of the cluster by time-of-flight secondary ion mass analysis combined with secondary ion electric current measurements. The comparison revealed that (1) secondary ion emission yields per C$$_{8}$$$$^{+}$$ impact increase with increasing incident energy within the energy range examined, (2) the 4.0 MeV C$$_{8}$$$$^{+}$$ impact provides higher emission yields than the impact of the monoatomic Mo ion with the same incident energy (4.0 MeV Mo$$^{+}$$), and (3) the 2.4 MeV C$$_{8}$$$$^{+}$$ impact exhibits comparable emission yields to that for the Mo ion impact with higher incident energy (14 MeV Mo$$^{4+}$$). Energetic cluster ion impacts effectively produce the characteristic secondary ions for poly-tyrosine, which is advantageous for highly sensitive amino acid detection in proteins using time-of-flight secondary ion mass analysis.

論文

Chloride complexation of Zr and Hf in HCl investigated by extended X-ray absorption fine structure spectroscopy; Toward characterization of chloride complexation of element 104, rutherfordium (Rf)

羽場 宏光*; 秋山 和彦*; 塚田 和明; 浅井 雅人; 豊嶋 厚史; 矢板 毅; 平田 勝; 末木 啓介*; 永目 諭一郎

Bulletin of the Chemical Society of Japan, 82(6), p.698 - 703, 2009/06

 被引用回数:10 パーセンタイル:39.92(Chemistry, Multidisciplinary)

8.0$$sim$$11.9Mの塩酸水溶液中での第4族元素Zr並びにHfの塩化物形成を広域X線吸収微細構造分光法(EXAFS)を用いて調べた。両元素の塩化物錯形成は塩酸濃度8.0Mでは、水和物[M(H$$_{2}$$O)$$_{8}$$]$$^{4+}$$(M=Zr,Hf)構造をとり、濃度の増加にしたがって塩化物イオンが配位し、11.9Mでは6塩化物錯体[MCl$$_{6}$$]$$^{2-}$$構造になることがわかった。この塩化物配位の連続的変化は以前のZr, Hfの陰イオン交換挙動をよく反映していた。今回のEXAFS法とZr, Hf及びRfのイオン交換実験の結果をもとに、RfもZr, Hfと同様に塩酸水溶液中では[Rf(H$$_{2}$$O)$$_{8}$$]$$^{4+}$$から[RfCl$$_{6}$$]$$^{2-}$$の構造を形成することが示唆された。

論文

Development of secondary ion mass spectroscopy using medium energy C$$_{60}$$ ion impact

平田 浩一*; 齋藤 勇一; 千葉 敦也; 阿達 正浩*; 山田 圭介; 鳴海 一雅

Nuclear Instruments and Methods in Physics Research B, 266(10), p.2450 - 2452, 2008/05

 被引用回数:13 パーセンタイル:64.66(Instruments & Instrumentation)

Time-of-flight (TOF) secondary ion mass spectroscopy was performed using primary C$$_{60}$$ ions with an energy range from several tens of keV to several hundreds of keV. Application of the spectroscopy to the analysis of a poly(amino acid) film revealed that characteristic peaks, necessary for identification of the amino acid in proteins, show higher intensities for medium energy C$$_{60}$$ (120 keV C$$_{60}^{+}$$ and 540 keV C$$_{60}^{2+}$$) impacts than those for low energy C$$_{60}$$ (30 keV C$$_{60}^{+}$$) impacts. This finding demonstrates that medium energy C$$_{60}$$ ion impacts are useful for highly sensitive characterization of amino acids.

論文

Organic contaminant detection of silicon wafers using negative secondary ions induced by cluster ion impacts

平田 浩一*; 齋藤 勇一; 千葉 敦也; 鳴海 一雅

Applied Physics Express, 1(4), p.047002_1 - 047002_3, 2008/04

 被引用回数:4 パーセンタイル:18.82(Physics, Applied)

Emission yields of carbon and hydrogenated carbon cluster secondary ions CpHq$$^pm$$ (p$$ge1$$, q$$ge0$$) originating from organic contaminants on a silicon wafer are compared between monoatomic (0.5 MeV/atom-C1$$^+$$) and cluster ion (0.5 MeV/atom-C8$$^+$$) impacts using time-of-flight (TOF) secondary ion mass spectrometry. CpHq$$^pm$$ for the cluster ion impact exhibits the highest emission yield per incident atom among CpHq$$^pm$$ with the same p number. The highest relative CpHq$$^pm$$ emission yield for the cluster ion impact reaches $$simeq 20$$ and $$simeq 60$$ times higher in comparison with those of CpHq$$^-$$ and CpHq$$^+$$ with the same p number for the impact of the monoatomic ion with the same velocity, respectively. Combination of negative secondary ion TOF measurements with cluster impact ionization is a promising tool for highly sensitive detection of organic-contaminants on silicon wafers.

論文

Chemical studies on rutherfordium (Rf) at JAERI

永目 諭一郎; 塚田 和明; 浅井 雅人; 豊嶋 厚史; 秋山 和彦; 石井 康雄; 佐藤 哲也; 平田 勝; 西中 一朗; 市川 進一; et al.

Radiochimica Acta, 93(9-10), p.519 - 526, 2005/00

 被引用回数:29 パーセンタイル:87.12(Chemistry, Inorganic & Nuclear)

東海研究所タンデム加速器を用いて進めてきた超重元素(104番元素)ラザホージウム(Rf)の単一原子レベルでの化学挙動研究について報告する。特に短寿命(78秒)で数分間に1原子の割合で生成するRfのイオン交換挙動を調べるために開発した自動迅速イオン交換分離装置の概要を紹介する。また最近得られたRfのフッ化物錯体のイオン交換挙動について詳しく述べる。これはRfのフッ化水素酸溶液中での陰イオン交換挙動が、周期表同族元素であるジルコニウムやハフニウムの挙動とは大きく異なっていて、Rfのフッ化物形成に相対論効果が寄与している可能性を指摘する興味深い結果である。

論文

Fluoride complexation of element 104, rutherfordium

羽場 宏光*; 塚田 和明; 浅井 雅人; 豊嶋 厚史; 秋山 和彦; 西中 一朗; 平田 勝; 矢板 毅; 市川 進一; 永目 諭一郎; et al.

Journal of the American Chemical Society, 126(16), p.5219 - 5224, 2004/04

 被引用回数:43 パーセンタイル:72.54(Chemistry, Multidisciplinary)

$$^{248}$$Cm($$^{18}$$O,5n)$$^{261}$$Rf反応で生成する104番元素ラザホージウム(Rf)のフッ化物錯体のイオン交換挙動を単一原子レベルで明らかにした。Rfの陰イオン交換挙動は、周期表同族元素であるジルコニウム(Zr)やハフニウム(Hf)の挙動とは明らかに異なることがわかり、Rfのフッ化物形成に相対論効果が寄与している可能性を指摘した。

論文

Chemical studies of the heaviest elements

永目 諭一郎; 羽場 宏光*; 塚田 和明; 浅井 雅人; 豊嶋 厚史; 後藤 真一*; 秋山 和彦; 金子 哲也; 阪間 稔*; 平田 勝; et al.

Nuclear Physics A, 734, p.124 - 135, 2004/04

 被引用回数:11 パーセンタイル:56.94(Physics, Nuclear)

超重元素(超アクチノイド元素)の化学研究についてレビューする。特に単一原子を対象にした化学実験の最近の進歩や、重元素領域で期待される化学結合における相対論効果の検証を中心に述べる。さらに原研で進めている超アクチノイド元素,ラザホージウム(Rf),ドブニウム(Db)の化学挙動研究からRfのイオン交換挙動について詳しく報告する。

論文

Transactinide nuclear chemistry at JAERI

永目 諭一郎; 羽場 宏光; 塚田 和明; 浅井 雅人; 秋山 和彦; 平田 勝; 西中 一朗; 市川 進一; 中原 弘道; 後藤 真一*; et al.

Czechoslovak Journal of Physics, 53, p.A299 - A304, 2003/00

 被引用回数:7 パーセンタイル:46.58(Physics, Multidisciplinary)

原研における超アクチノイド元素核化学研究の現状をまとめて報告する。これまで超アクチノイド元素合成のための実験装置の整備を進め、タンデム加速器を用いて104番元素$$^{261}$$Rf及び105番元素$$^{262}$$Dbを合成した。また短寿命の超アクチノイド元素を迅速に単一原子レベルで化学挙動を調べるための迅速イオン交換分離装置を開発した。最近、この装置を用いて104番元素ラザホージウム(Rf)の酸溶液中での陰イオン交換挙動を初めて明らかにした。

論文

Production and chemistry of transuranium elements

永目 諭一郎; 平田 勝; 中原 弘道

Handbook of Nuclear Chemistry, Vol.2, p.219 - 282, 2003/00

核・放射化学ハンドブックの「超ウラン元素の製造と化学」の章をまとめたものである。超ウラン元素発見の歴史,未知の超ウラン核種の合成と同定,超ウラン原子核研究の最近の進歩と成果について述べる。また超ウラン元素の溶液,固体化学的性質についてアクチノイド概念の立場から解説するとともに、最近のXAFSを用いた実験や計算科学的手法によるアクチノイド研究を概説する。

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