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Fukuda, Yuji; Akahane, Yutaka; Aoyama, Makoto; Inoue, Norihiro*; Ueda, Hideki; Nakai, Yoshiki*; Tsuji, Koichi*; Yamakawa, Koichi; Hironaka, Yoichiro*; Kishimura, Hiroaki*; et al.
Applied Physics Letters, 85(21), p.5099 - 5101, 2004/11
Times Cited Count:11 Percentile:42.83(Physics, Applied)We have demonstrated diffraction from Si(111) crystal using X-rays from highly ionized Ar ions produced by laser irradiation with an intensity of 610 W/cm and a pulse duration of 30 fs acting upon micron-sized Ar clusters. The measured total photon flux and line width in the He line (3.14 keV) were 410 photons/shot/4sr and 3.7 eV (FWHM), respectively, which is sufficient to utilize as a debris-free light source for time-resolved X-ray diffraction studies.
Zhidkov, A. G.; Sasaki, Akira; Utsumi, Takayuki*; Fukumoto, Ichiro; Tajima, Toshiki; Saito, Fumikazu*; Hironaka, Yoichiro*; Nakamura, Kazutaka*; Kondo, Kenichi*; Yoshida, Masataka*
Physical Review E, 62(5), p.7232 - 7240, 2000/11
Times Cited Count:51 Percentile:86(Physics, Fluids & Plasmas)no abstracts in English