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Toyokawa, Hidenori*; Saji, Choji*; Kawase, Morihiro*; Wu, S.*; Hurukawa, Yukihito*; Kajiwara, Kentaro*; Sato, Masugu*; Hirono, Toko*; Shiro, Ayumi*; Shobu, Takahisa; et al.
Journal of Instrumentation (Internet), 12(1), p.C01044_1 - C01044_7, 2017/01
Times Cited Count：4 Percentile：21.22(Instruments & Instrumentation)We have been developing CdTe pixel detectors combined with a Schottky diode sensor and photon-counting ASICs. The hybrid pixel detector was designed with a pixel size of 200 micro-meter by 200 micro-meter and an area of 19 mm by 20 mm or 38.2 mm by 40.2 mm. The photon-counting ASIC, SP8-04F10K, has a preamplifier, a shaper, 3-level window-type discriminators and a 24-bits counter in each pixel. The single-chip detector with 100 by 95 pixels successfully operated with a photon-counting mode selecting X-ray energy with the window comparator and stable operation was realized at 20
C. We have performed a feasibility study for a white X-ray microbeam experiment. Laue diffraction patterns were measured during the scan of the irradiated position in a silicon steel sample. The grain boundaries were identified by using the differentials between adjacent images at each position.
Imazono, Takashi; Hirono, Toko*; Kimura, Hiroaki*; Saito, Yuji; Ishino, Masahiko; Muramatsu, Yasuji*; Koike, Masato; Sano, Kazuo*
Review of Scientific Instruments, 76(12), p.126106_1 - 126106_4, 2005/12
Times Cited Count：14 Percentile：55.4(Instruments & Instrumentation)Polarizance of a reflection-type polarizer made with a synthetic mica (fluorophlogopite) single crystal was evaluated at the photon energy of 880 eV by means of the rotating-analyzer method in conjunction with the evaluation of the degree of linear polarization of the insertion beamline, SPring-8 BL23SU, featuring an APPLE-2 type variably polarizing undulator. When the undulator was tuned to the horizontal linear polarization mode, the maximum reflectances for s- and p-polarization for a symmetric Bragg reflection of synthetic mica(002) were 2.6% and 0.013%, respectively, at incident angles of near 45
. Our analysis based on the rotating-analyzer method gave the polarizance of the polarizer of at least 0.997 
0.002 and the degree of linear polarization of 0.993 0.004 in the linear polarization mode.
Imazono, Takashi; Ishino, Masahiko; Koike, Masato; Kimura, Hiroaki*; Hirono, Toko*; Sano, Kazuo*
Review of Scientific Instruments, 76(2), p.023104_1 - 023104_4, 2005/02
Times Cited Count：13 Percentile：53.56(Instruments & Instrumentation)To develop the polarizer functioning in the soft X-ray region of 1 keV, the polarization performance of muscovite mica has been investigated theoretically with simulation code based on dynamical theory. As the result of calculation, muscovite mica is found to be promising candidate as a reflection-type polarizer with the reflectivity for s-polarization of 0.03 at approximately 0.9 keV at the angle of incidence of 45. In order to verify the polarization performance of muscovite mica experimentally, a symmetric Bragg reflection measurement of muscovite mica(002) was carried out using a linearly polarized undulator radiation. As the result, the maximum reflectivity for s-polarization and the extinction ratio of muscovite mica were approximately 0.018 and 200 at 878 eV, respectively. This result indicates that muscovite mica works as a practical polarizer in the soft X-ray region.
Imazono, Takashi; Hirono, Toko*; Kimura, Hiroaki*; Saito, Yuji; Muramatsu, Yasuji*; Sano, Kazuo*; Ishino, Masahiko; Koike, Masato
no journal, ,
We have developed crystal-type polarizing elements to evaluate the state of polarization of soft X-ray in the 1-keV region. In our previous study, we have found out that natural muscovite mica is a promising candidate for a reflection-type polarizer at 0.88 keV. The polarization performances of muscovite and fluorophlogopite micas were evaluated by the rotating-analyzer method at the BL23SU beamline, which tuned to the horizontal linear polarization mode, of SPring-8. As the result, fluorophlogopite mica was found to be high efficient reflection-type polarizer having the polarizance of 0.998. Also, using it, the degree of linear polarization of the incident light was determined to be 0.993 at 0.88 keV.
Imazono, Takashi; Hirono, Toko*; Kimura, Hiroaki*; Saito, Yuji; Muramatsu, Yasuji*; Sano, Kazuo*; Ishino, Masahiko; Koike, Masato
no journal, ,
An experimental evaluation for the state of polarization of soft X-ray in the 1-keV region between 0.7 and 1.9 keV has not been performed because there is no polarizing element suitable for this energy region. In order to evaluate the state of polarization of polarized soft X-ray in the 1-keV region, we have developed a reflection-type polarizer by use of fluorophlogopite mica crystal which has the lattice constant of approximately 1 nm and can be made large single-crystal in these days. The polarization performance of fluorophlogopite mica was evaluated by the rotating-analyzer method at the BL23SU beamline, which was tuned to horizontal linear polarization mode, of SPring-8. As the result, the reflectance for s- (p-) polarization and the polarizance of fluorophlogopite(002) was 2.6% (0.013%) and 0.998 at the incident angle of 45.02 at 0.88 keV, respectively. This indicates that fluorophlogopite mica works the high efficient reflection-type polarizer. Using it, the degree of linear polarization of the incident light at 0.88 keV was determined. The polarization performances of muscovite and phlogopite micas are also mentioned.
