Internal strain measurement by neutron diffraction under transverse compressive stress for NbSn wires with and without Cu-Nb reinforcement

Nakamoto, Mio*; Sugano, Michinaka*; Ogitsu, Toru*; Sugimoto, Masahiro*; Taniguchi, Ryo*; Hirose, Kiyoshige*; Kawasaki, Takuro; Gong, W.; Harjo, S.; Awaji, Satoshi*; et al.

IEEE Transactions on Applied Superconductivity, 34(5), p.8400806_1 - 8400806_6, 2024/08

https://doi.org/10.1109/TASC.2024.3379124

Advanced analysis technology for new material and product development

Sasaki, Hirokazu*; Nishikubo, Hideo*; Nishida, Shinsuke*; Yamazaki, Satoshi*; Nakasaki, Ryusuke*; Isomatsu, Takemi*; Minato, Ryuichiro*; Kinugawa, Kohei*; Imamura, Akihiro*; Otomo, Shinya*; et al.

Furukawa Denko Jiho, (138), p.2 - 10, 2019/02

https://www.furukawa.co.jp/rd/review/fj138/fj138_02.pdf

no abstracts in English