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Journal Articles

Microstructure analysis using X-ray absorption on heat-affected zone of reactor pressure vessel steel

Iwata, Keiko; Takamizawa, Hisashi; Ha, Yoosung; Okamoto, Yoshihiro; Shimoyama, Iwao; Honda, Mitsunori; Hanawa, Satoshi; Nishiyama, Yutaka

Photon Factory Activity Report 2017, 2 Pages, 2018/00

no abstracts in English

Journal Articles

Proposed cesium-free mineralization method for soil decontamination; Demonstration of cesium removal from weathered biotite

Honda, Mitsunori; Shimoyama, Iwao; Kogure, Toshihiro*; Baba, Yuji; Suzuki, Shinichi; Yaita, Tsuyoshi

ACS Omega (Internet), 2(12), p.8678 - 8681, 2017/12

 Times Cited Count:0 Percentile:100(Chemistry, Multidisciplinary)

Journal Articles

Challenges for enhancing Fukushima environmental resilience, 4; Development of physical and heat treatment methods on aiming at decontamination, volume reduction and reuse of contaminated soil

Yaita, Tsuyoshi; Honda, Mitsunori; Shimoyama, Iwao; Ito, Kenichi*; Mampuku, Yuzo*; Tsuji, Takuya; Matsumura, Daiju

Nippon Genshiryoku Gakkai-Shi, 59(8), p.483 - 487, 2017/08

no abstracts in English

Journal Articles

Development of cesium-free mineralization for decontamination and reuse of radioactive contaminated soil in Fukushima

Shimoyama, Iwao; Honda, Mitsunori; Kogure, Toshihiro*; Baba, Yuji; Hirao, Norie*; Okamoto, Yoshihiro; Yaita, Tsuyoshi; Suzuki, Shinichi

Photon Factory News, 35(1), p.17 - 22, 2017/05

We introduce Cs-free mineralization (CFM) for Cs removal and reuse of radioactive-contaminated soil in Fukushima and report recent work conducted in the BL27A beamline in Photon Factory. In this work, we investigated compositional and structural changes of Cs-sorbed weathered biotite (WB) before and after heating treatment with addition of NaCl-CaCl$$_{2}$$ salts under low-pressure condition, to study Cs desorption mechanism from clay minerals. X-ray fluorescence spectroscopy clarified that almost all Cs and K were removed with the salts at 700 $$^{circ}$$C. On the other hand, Ca increased with heating temperature. X-ray diffraction and transmission electron microscopy analysis clarified that phase transitions from WB to some Ca-rich silicate minerals, e.g., augite, were caused by the heating treatment with the salt. Based on these results, CFM is proposed for Cs removal utilizing the mechanism in which large monovalent cations are discharged with accompanying the phase transition. We also discuss the role of Cl in this reaction showing chemical bonding change of Cl observed using X-ray absorption spectroscopy in the early stage of the chemical reaction.

Journal Articles

Mechanism of Cs removal from Fukushima weathered biotite by heat treatment with a NaCl-CaCl$$_{2}$$ mixed salt

Honda, Mitsunori; Okamoto, Yoshihiro; Shimoyama, Iwao; Shiwaku, Hideaki; Suzuki, Shinichi; Yaita, Tsuyoshi

ACS Omega (Internet), 2(2), p.721 - 727, 2017/02

 Times Cited Count:6 Percentile:49.18(Chemistry, Multidisciplinary)

Journal Articles

X-ray absorption fine structure at the cesium $$L$$3 absorption edge for cesium sorbed in clay minerals

Honda, Mitsunori; Shimoyama, Iwao; Okamoto, Yoshihiro; Baba, Yuji; Suzuki, Shinichi; Yaita, Tsuyoshi

Journal of Physical Chemistry C, 120(10), p.5534 - 5538, 2016/03

 Times Cited Count:14 Percentile:30.57(Chemistry, Physical)

Journal Articles

Development of fluorescence XAFS system in soft X-ray region toward operando conditions using polycapillary X-ray lens

Honda, Mitsunori; Shimoyama, Iwao; Baba, Yuji; Suzuki, Shinichi; Okamoto, Yoshihiro; Yaita, Tsuyoshi

e-Journal of Surface Science and Nanotechnology (Internet), 14, p.35 - 38, 2016/02

Journal Articles

Observation of oriented organic semiconductor using Photo-Electron Emission Microscope (PEEM) with polarized synchrotron

Sekiguchi, Tetsuhiro; Baba, Yuji; Hirao, Norie; Honda, Mitsunori; Izumi, Toshinori; Ikeura, Hiromi*

Molecular Crystals and Liquid Crystals, 622(1), p.44 - 49, 2015/12

BB2014-1632.pdf:0.72MB

 Times Cited Count:0 Percentile:100(Chemistry, Multidisciplinary)

The molecular orientation is one of the important factors for controlling various properties in organic semiconductor materials. Films are usually heterogeneous. Thus they exist as a mixture of microscopic domains which have a variety of orientation directions. Therefore, it is essential to observe selectively microscopic domains with different orientation direction. In this work, we have developed the photoelectron emission microscopy (PEEM) system combined with the linearly polarized vacuum ultraviolet (VUV) light or synchrotron radiation (SR) X-rays. PEEM images (FOV = ca.50 micro m) for poly(3-hexylthiophene), P3HT thin films were observed under the UV irradiation with various polarization angles, including in-plain and out-of-plain polarization. Morphologies at some bright parts are different each other. The resultant observation suggests that it enables us to distinguish oriented micro-domains with specific directions of polymer chain axis from other amorphous parts.

Journal Articles

Integrated tokamak modelling with the fast-ion Fokker-Planck solver adapted for transient analyses

Toma, Mitsunori; Hamamatsu, Kiyotaka; Hayashi, Nobuhiko; Honda, Mitsuru; Ide, Shunsuke

Plasma Physics and Controlled Fusion, 57(9), p.095007_1 - 095007_9, 2015/09

 Times Cited Count:2 Percentile:84.16(Physics, Fluids & Plasmas)

Integrated tokamak modelling that enables the simulation of an entire discharge periodis indispensable for designing advanced tokamak plasmas. For this purpose, we extend the integrated code TOPICS to make it more suitable for transient analyses in the fast-ion part. The fast-ion Fokker-Planck solver is integrated into TOPICS at the same level as the bulk transport solver so that the time evolutions of the fast ion and the bulk plasma are consistent with each other as well as with the equilibrium magnetic field. The integrated code is applied to ramp-up simulations for JT-60SA and ITER to confirm its capability and effectiveness in transient analyses. In the integrated simulations, the coupled evolution of the fast ions, plasma profiles, and equilibrium magnetic fields are presented.

Journal Articles

Advance in integrated modelling towards prediction and control of JT-60SA plasmas

Hayashi, Nobuhiko; Honda, Mitsuru; Shiraishi, Junya; Miyata, Yoshiaki; Wakatsuki, Takuma; Hoshino, Kazuo; Toma, Mitsunori; Suzuki, Takahiro; Urano, Hajime; Shimizu, Katsuhiro; et al.

Europhysics Conference Abstracts (Internet), 39E, p.P5.145_1 - P5.145_4, 2015/06

Journal Articles

A Fluorescence XAFS measurement instrument in the Soft X-ray region toward observation under operando conditions

Honda, Mitsunori; Baba, Yuji; Shimoyama, Iwao; Sekiguchi, Tetsuhiro

Review of Scientific Instruments, 86(3), p.035103_1 - 035103_5, 2015/03

 Times Cited Count:6 Percentile:53.85(Instruments & Instrumentation)

Journal Articles

Investigation of the influence of coadsorbent dye upon the interfacial structure of dye-sensitized solar cells

Honda, Mitsunori; Yanagida, Masatoshi*; Han, L.*; Miyano, Kenjiro*

Journal of Chemical Physics, 141(17), p.174709_1 - 174709_7, 2014/11

AA2014-0557.pdf:0.81MB

 Times Cited Count:3 Percentile:83.95(Chemistry, Physical)

Journal Articles

Electrochemical immobilization of biomolecules on gold surface modified with monolayered L-cysteine

Honda, Mitsunori; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie

Thin Solid Films, 556, p.307 - 310, 2014/04

 Times Cited Count:5 Percentile:66.57(Materials Science, Multidisciplinary)

Journal Articles

Labeling co-sensitizer dye for XPS quantification in coadsorption dye-sensitized solar cells

Honda, Mitsunori; Yanagida, Masatoshi*; Han, L.*; Miyano, Kenjiro*

e-Journal of Surface Science and Nanotechnology (Internet), 12, p.63 - 67, 2014/02

Journal Articles

Orientation effect of organic semiconducting polymer revealed using Photo-Electron Emission Microscope (PEEM)

Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Hirao, Norie; Honda, Mitsunori; Izumi, Toshinori; Ikeura, Hiromi*

Photon Factory Activity Report 2013, Part B, P. 546, 2014/00

The molecular orientation is one of the important factors for controlling various properties in organic semiconductor materials. Films are usually heterogeneous. Thus they exist as a mixture of microscopic domains which have a variety of orientation directions. Therefore, it is essential to observe selectively microscopic domains with different orientation direction. In this work, we have developed the photoelectron emission microscope (PEEM) system combined with the linearly polarized vacuum ultraviolet (VUV) light or synchrotron radiation (SR) X-rays. PEEM images for poly(3-hexylthiophene), P3HT thin films were observed under synchrotron X-ray irradiation with linearly polarization. In conclusion, it was found that PEEM with polarized synchrotron can be a powerful tool that gives information of molecular orientation in nano-meter scale.

Journal Articles

Formation of NaCl-type lanthanum monohydride under high pressure; Discovery of novel rare-earth metal hydride using synchrotron radiation X-ray and neutron

Machida, Akihiko; Honda, Mitsunori*; Hattori, Takanori; Sano, Asami; Watanuki, Tetsu; Katayama, Yoshinori; Aoki, Katsutoshi; Oshita, Hidetoshi*; Ikeda, Kazutaka*; Otomo, Toshiya*

Hamon, 23(2), p.131 - 136, 2013/05

Recently, we have revealed formation of NaCl-type LaD using synchrotron radiation X-ray diffraction and neutron diffraction measurements under high pressure. Previously, we have found that LaH$$_2$$ decomposes into two phases,which have different hydrogen compositions, the H-poor and H-rich phases, at 11 GPa at room temperature by synchrotron radiation X-ray diffraction. Recent neutron diffraction measurements on LaD$$_2$$ confirmed the formation of a NaCl-type LaD as the D-poor phase. This is the first observation of a formation of the rare-earth metal monodeuteride. Present result indicates that that rare-earth metal can form a series of stoichiometric hydrides,such as mono-, di-, and trihydride with the fcc metal lattice.

Journal Articles

Orientation of silicon phthalocyanine thin films revealed using polarized X-ray absorption spectroscopy

Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Hirao, Norie; Honda, Mitsunori; Deng, J.*

Photon Factory Activity Report 2012, Part B, P. 68, 2013/00

The orientation of organic semiconducting molecules on surfaces plays a crucial role in improving the properties of electronic devices. We prepared thin films of silicon phthalocyanine dichroride (SiPcCl$$_{2}$$) on graphite spin-cast followed by heating to 350$$^{circ}$$C at ambient condition. We investigate the molecular orientation of the films using angle-dependent near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy. Si 1s NEXAFS spectra for the thin films after annealing are very different each other, indicating that the corresponding reactions thus the structures of final products are different. The structures of the reaction products are estimated with the help of ab initio molecular orbital calculations that fit the observed NEXAFS spectra.

Journal Articles

Formation of NaCl-type monodeuteride LaD by the disproportionation reaction of LaD$$_{2}$$

Machida, Akihiko; Honda, Mitsunori*; Hattori, Takanori; Sano, Asami; Watanuki, Tetsu; Katayama, Yoshinori; Aoki, Katsutoshi; Komatsu, Kazuki*; Arima, Hiroshi*; Oshita, Hidetoshi*; et al.

Physical Review Letters, 108(20), p.205501_1 - 205501_5, 2012/05

 Times Cited Count:8 Percentile:43.73(Physics, Multidisciplinary)

Hydrogen atoms absorbed in a metal occupy the interstitial sites of the metal lattice. In an fcc metal lattice, each metal atom has two tetrahedral (T) and one octahedral (O) sites that can accommodate hydrogen. Rare-earth metal La forms T-site occupied LaH$$_2$$ and fully occupied LaH$$_3$$. O-site occupied or NaCl-type monohydride has yet to be reported for rare-earth metals. Previous X-ray diffraction measurements revealed the pressure-induced decomposition of an fcc-LaH$$_{2.3}$$ into H-rich and H-poor phases around 11 GPa. The present neutron diffraction measurements on LaD$$_{2}$$ confirm the formation of NaCl-type LaD as a counterpart of the D-rich LaD$$_{2+delta}$$ by disproportionation. First-principle calculations demonstrate that the NaCl-type LaH is stabilized at high pressures. Finding the NaCl-type LaH will pave the way for investigations on the site-dependent nature of hydrogen-metal interactions.

Journal Articles

Microscopic observation of lateral diffusion at Si-SiO$$_{2}$$ interface by photoelectron emission microscopy using synchrotron radiation

Hirao, Norie; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Honda, Mitsunori*

Applied Surface Science, 258(3), p.987 - 990, 2011/11

 Times Cited Count:3 Percentile:80.34(Chemistry, Physical)

The lateral surface diffusion at Si-SiO$$_{2}$$ interface has been observed at nanometer scale using photoelectron emission microscopy (PEEM) combined with synchrotron soft X-ray excitation. The samples investigated were Si-SiO$$_{x}$$ micro-patterns prepared by O$$_{2}$$$$^{+}$$ ion implantation in Si(0 0 1) wafer using a mask. The lateral spacial resolution of the PEEM system was about 41 nm. The brightness of each spot in the PEEM images changed depending on the photon energy around the Si ${it K}$-edge, in proportion to the X-ray absorption intensity of the corresponding valence states. It was found that the lateral diffusion occurs at lower temperature than that reported for the longitudinal diffusion at the Si-SiO$$_{2}$$ interface. It was also found that no intermediate valence states such as SiO (Si$$^{2+}$$) exist at the Si-SiO$$_{2}$$ interface during the diffusion. The observed differences between lateral and longitudinal diffusion are interpreted by the sublimated property of silicon monoxide (SiO).

Journal Articles

Chemical-state-selective mapping at nanometer scale using synchrotron radiation and photoelectron emission microscopy

Hirao, Norie; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Honda, Mitsunori

Analytical Sciences, 26(8), p.835 - 840, 2010/08

 Times Cited Count:2 Percentile:91.49(Chemistry, Analytical)

For surface analyses of semiconductor devices and various functional materials, it has become indispensable to analyze valence states at nanometer scale due to the rapid developments of nanotechnology. Since a method for microscopic mapping dependent on the chemical bond states has not been established so far, we have developed a photoelectron emission microscopy (PEEM) system combined with synchrotron soft X-ray excitation. The samples investigated were Si/SiO$$_{x}$$ micro-patterns prepared by O$$_{2}$$$$^{+}$$ ion implantation in Si(001) wafer using a mask. PEEM images excited by various photon energies around the Si ${it K}$-edge were observed. The lateral spacial resolution of the system was about 41nm. The brightness of each spot in PEEM images changed depending on the photon energy, due to the X-ray absorption intensity of the respective chemical state. Since the surface of this sample was topographically flat, it has been demonstrated that the present method can be applied to observations of the microscopic pattern, depending not on the morphology, but only on the valence states of silicon. We have also ${it in-situ}$ measured the changes of the PEEM images upon annealing, and elucidated the mechanism of the lateral diffusion of oxygen and valence states of silicon at the nanometer scale.

160 (Records 1-20 displayed on this page)