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Journal Articles

Analysis of failure caused by cosmic rays in high-voltage high-power semiconductor devices, 2

Matsuda, Hideo*; Omura, Ichiro*; Sakiyama, Yoko*; Urano, Satoshi*; Iesaka, Susumu*; Ohashi, Hiromichi*; Hirao, Toshio; Abe, Hiroshi; Ito, Hisayoshi; Mori, Hidenobu; et al.

JAERI-Review 2002-035, TIARA Annual Report 2001, p.11 - 13, 2002/11

no abstracts in English

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