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Journal Articles

Critical current measurement of prototype NbTi cable-in-conduit conductor for JT-60SA

Kizu, Kaname; Tsuchiya, Katsuhiko; Obana, Tetsuhiro*; Takahata, Kazuya*; Hoshi, Ryo; Hamaguchi, Shinji*; Nunoya, Yoshihiko; Yoshida, Kiyoshi; Matsukawa, Makoto; Yanagi, Nagato*; et al.

Fusion Engineering and Design, 84(2-6), p.1058 - 1062, 2009/06

 Times Cited Count:12 Percentile:62.42(Nuclear Science & Technology)

The maximum magnetic field and maximum current of EF coils for JT-60SA is 6.2T, 20 kA, respectively. The EF coil conductors are NbTi cable-in-conduit (CIC) conductor with SS316L conduit. In order to confirm the performance of current sharing temperature ($$T$$$$_{rm cs}$$) tests under coil operational condition was performed. As a results, the degradation of $$T$$$$_{rm cs}$$ was 0.01-0.08 K indicating that the conductor design and its fabrication method is appropriate. Experimental results were compared with the $$I$$ and $$T$$ by standard plasma operation scenario. It was confirmed that the conductor has $$T$$$$_{rm cs}$$ margin of $$>$$ 1K.

Journal Articles

Upgrading the NIFS superconductor test facility for JT-60SA cable-in-conduit conductors

Obana, Tetsuhiro*; Takahata, Kazuya*; Hamaguchi, Shinji*; Yanagi, Nagato*; Mito, Toshiyuki*; Imagawa, Shinsaku*; Kizu, Kaname; Tsuchiya, Katsuhiko; Hoshi, Ryo; Yoshida, Kiyoshi

Fusion Engineering and Design, 84(7-11), p.1442 - 1445, 2009/06

 Times Cited Count:18 Percentile:74.84(Nuclear Science & Technology)

The superconductor test facility in National Institute for Fusion Science (NIFS) has been upgraded in order to test cable-in-conduit (CIC) conductors for the JT-60SA equilibrium field (EF) coil. In the test facility, supercritical helium (SHe) lines were newly assembled with transfer tubes and a heat exchanger. The CIC conductor was covered with a thermal insulation vessel filled with gas helium at atmospheric pressure. The temperature of the conductor was varied using a film heater attached to an inlet pipe. The Ic and Tcs measurements of the prototype CIC conductor have successfully been carried out with the upgraded test facility. In the measurements, the conductor temperature was precisely controlled.

Journal Articles

Total dose effects on heavy-ion induced gate current in MOS structure

Takahashi, Yoshihiro*; Fugane, Masaru*; Imagawa, Ryo*; Owaki, Akihiro*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

JAEA-Review 2008-055, JAEA Takasaki Annual Report 2007, P. 7, 2008/11

no abstracts in English

Oral presentation

Analysis of transport properties of charge induced in SOI structure devices by heavy ion irradiation

Onishi, Kazunori*; Takahashi, Yoshihiro*; Nakajima, Yasuhito*; Nagasawa, Takaharu*; Fugane, Masaru; Imagawa, Ryo*; Nomoto, Keisuke*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Heavy-ion induced gate current in MOSFET

Fugane, Masaru; Takahashi, Yoshihiro*; Nakajima, Yasuhito*; Nagasawa, Takaharu*; Imagawa, Ryo*; Nomoto, Keisuke*; Onishi, Kazunori*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Heavy ion induced transient currents on MOS capacitors before and after $$gamma$$ irradiation

Onoda, Shinobu; Fugane, Masaru; Hirao, Toshio; Oshima, Takeshi; Takahashi, Yoshihiro*; Imagawa, Ryo*; Onishi, Kazunori*

no journal, , 

no abstracts in English

Oral presentation

Critical current measurement of prototype NbTi cable-in-conduit conductor for JT-60SA

Kizu, Kaname; Tsuchiya, Katsuhiko; Hoshi, Ryo; Yoshida, Kiyoshi; Matsukawa, Makoto; Obana, Tetsuhiro*; Takahata, Kazuya*; Hamaguchi, Shinji*; Yanagi, Nagato*; Imagawa, Shinsaku*; et al.

no journal, , 

The maximum magnetic field and maximum current of EF coils for JT-60SA is 6.2 T, 20 kA, respectively. The EF coil conductors are NbTi cable-in-conduit (CIC) conductor with SS316L conduit. In order to confirm the performance of current sharing temperature (Tcs) tests under coil operational condition was performed. As a results, the degradation of Tcs was 0.02-0.07 K indicating that the conductor design and its fabrication method is appropriate.

Oral presentation

Relation between transient current induced in MOS devices by heavy ions and total dose effects

Imagawa, Ryo*; Fugane, Masaru*; Takahashi, Yoshihiro*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Clarification of single event effects in MOS structure devices

Takahashi, Yoshihiro*; Fugane, Masaru*; Imagawa, Ryo*; Owaki, Akihiro*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Heavy-ion induced currents in SOI-pn diodes

Takahashi, Yoshihiro*; Imagawa, Ryo*; Owaki, Akihiro*; Takeyasu, Hidenori*; Hirao, Toshio; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi

no journal, , 

no abstracts in English

10 (Records 1-10 displayed on this page)
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