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Ohshima, Hiroyuki; Morishita, Masaki*; Aizawa, Kosuke; Ando, Masanori; Ashida, Takashi; Chikazawa, Yoshitaka; Doda, Norihiro; Enuma, Yasuhiro; Ezure, Toshiki; Fukano, Yoshitaka; et al.
Sodium-cooled Fast Reactors; JSME Series in Thermal and Nuclear Power Generation, Vol.3, 631 Pages, 2022/07
This book is a collection of the past experience of design, construction, and operation of two reactors, the latest knowledge and technology for SFR designs, and the future prospects of SFR development in Japan. It is intended to provide the perspective and the relevant knowledge to enable readers to become more familiar with SFR technology.
Inoue, Keisuke*; Teraoka, Yuden
Journal of Physics; Conference Series, 417, p.012034_1 - 012034_6, 2013/03
Times Cited Count:3 Percentile:67.34(Materials Science, Coatings & Films)Inoue, Keisuke*; Teraoka, Yuden
Protection of Materials and Structures from the Space Environment; Astrophysics and Space Science Proceedings, Vol.32, p.521 - 530, 2013/00
Teraoka, Yuden; Inoue, Keisuke*; Jinno, Muneaki*; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Takaoka, Tsuyoshi*; Yoshigoe, Akitaka; Komeda, Tadahiro*
Dai-56-Kai Nihon Gakujutsu Kaigi Zairyo Kogaku Rengo Koenkai Koen Rombunshu, p.360 - 361, 2012/10
no abstracts in English
Teraoka, Yuden; Inoue, Keisuke*; Jinno, Muneaki*; Harries, J.; Yoshigoe, Akitaka
Dai-55-Kai Nihon Gakujutsu Kaigi Zairyo Kogaku Rengo Koenkai Koen Rombunshu, p.236 - 237, 2011/10
no abstracts in English
Inoue, Keisuke; Teraoka, Yuden
Denki Gakkai Rombunshi, C, 130(10), p.1817 - 1818, 2010/10
The effective attenuation length (EAL) is a necessary parameter to estimate the thickness of SiO overlayer by X-ray photoemission spectroscopy (XPS). Inelastic mean free path (IMFP) is often used instead of EAL because EAL is scarcely known. EAL values were determined experimentally in the photon energy region from 480 eV to 800 eV using synchrotron radiation photoemission spectroscopy. Although EALs estimated are different from calculated IMFPs, EALs, estimated without suboxides, are mostly close to theoretically-calculated IMFPs.
Kakinouchi, Keisuke*; Nakamura, Tsutomu*; Tamada, Taro; Adachi, Hiroaki*; Sugiyama, Shigeru*; Maruyama, Mihoko*; Takahashi, Yoshinori*; Takano, Kazufumi*; Murakami, Satoshi*; Inoue, Tsuyoshi*; et al.
Journal of Applied Crystallography, 43(4), p.937 - 939, 2010/08
Times Cited Count:4 Percentile:48.24(Chemistry, Multidisciplinary)A method for growing large protein crystals is described. In this method, a cut pipette tip is used to hang large-scale droplets (maximum volume 200 l) consisting of protein and precipitating agents. A crystal grows at the vapor-liquid interface; thereafter the grown crystal can be retrieved by droplet-droplet contact both for repeated macroseeding and for mounting crystals in a capillary. Crystallization experiments with peroxiredoxin of K1(thioredoxin peroxidase, ApTPx) and hen egg white lysozyme demonstrated that this large-scale hanging-drop method could produce a large-volume crystal very effectively. A neutron diffraction experiment confirmed that an ApTPx crystal (6.2 mm) obtained by this method diffracted to beyond 3.5 resolution.
Parajuli, D.; Khunathai, K.*; Adhikari, C. R.*; Inoue, Katsutoshi*; Oto, Keisuke*; Kawakita, Hidetaka*; Funaoka, Masamitsu*; Hirota, Koichi
Minerals Engineering, 22(13), p.1173 - 1178, 2009/10
Times Cited Count:44 Percentile:88.02(Engineering, Chemical)Yoshikawa, Kiyoshi*; Inoue, Nobuyuki*; Yamazaki, Tetsuo*; Makino, Keisuke*; Yamamoto, Yasushi*; Toku, Hisayuki*; Masuda, Kai*; Kii, Toshiteru*; Onishi, Masami*; Horiike, Hiroshi*; et al.
JAERI-Tech 2002-020, 63 Pages, 2002/03
no abstracts in English
Harries, J.; Tode, Mayumi; Sumimoto, Yuichi; Inoue, Keisuke; Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
Using the high energy resolution surface chemistry apparatus at SPring-8's BL23SU it is possible to record angular and chemical-state resolved X-ray photoelectron spectra. Chemical-state specific depth profile information can be obtained from these spectra using the maximum entropy method. Here we describe progress made in the combination of these two techniques, with the specific example of the depth-profiling of various nitridation states present in a Al(111) sample nitrided using a supersonic molecular beam.
Harries, J.; Tode, Mayumi; Inoue, Keisuke; Sumimoto, Yuichi; Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
There are many available methods for determining the elemental distributions within a sample in the depth direction, but angle-resolved X-ray photoelectron spectroscopy offers the advantage of chemica-state specificity. At the surface chemistry station at BL23SU, SPring-8, we have recorded depth-profiles for thin films generated using supersonic molecular beams and ion beams. To extract the depth-direction information from the angular resolved spectra we use the maximum entropy method. We explain the techniques, and present the specific example of the natural oxide of VCrTi, a hydrogen storage material. Also, we investigate the thermal stability of the oxide by generating depth profiles during annealing of the sample.
Teraoka, Yuden; Inoue, Keisuke
no journal, ,
The effective attenuation length (EAL) for the photoelectron energy used is a necessary parameter for measurements of the thicknesses of overlayer films by XPS. However it has not been measured, so IMFP is substituted. All experiments were performed with the surface reaction analysis apparatus (SUREAC2000) constructed at the BL23U in the SPring-8. All measured EALs are longer than IMFP. EALs, which are calculated without suboxides, are near theoretically-calculated IMFP.
Teraoka, Yuden; Inoue, Keisuke*; Kawakami, Yasunori*; Hiraya, Atsunari*
no journal, ,
The oxidation states of Ni(111) surface, which were made by irradiation of supersonic O molecular beam (SSOMB), were analyzed by synchrotron radiation photoemission spectroscopy (SR-XPS). After irradiation of SSOMB on the Ni(111) surface to some extent, the evolution of surface oxides were observed by core level photoemission spectra of Ni2p and O1s using SR-XPS. The surface temperature was kept to be 300 K during SSOMB irradiation and SR-XPS measurements. The SR energy was 680 eV. Oxygen uptake curves were measured at every translational energy of O beam. Although the sticking probability was almost constant in the range of 0.6 eV to 2.0 eV, the remarkable increase was observed in the region over 2.0 eV. A threshold was found to be 2.0 eV.
Inoue, Keisuke*; Teraoka, Yuden; Jinno, Muneaki
no journal, ,
The effective attenuation length (EAL) is a necessary parameter for estimating the thin film thickness using X-ray photoemission spectroscopy (XPS). The inelastic mean free path (IMFP) is often used instead of the EAL because EAL is scarcely known. In this experiment, EAL values of SiO were measured in the photon energy region of 480 eV to 800 eV using synchrotron radiation photoemission spectroscopy. The estimated EALs are different from calculated IMFPs.
Inoue, Keisuke*; Teraoka, Yuden
no journal, ,
In this study, the oxidation states of Ni(111) surface, made by irradiation of a supersonic O molecular beam (SSOMB), were analyzed using synchrotron radiation photoemission spectroscopy (SR-XPS). The surface temperature was 300 K during both SSOMB irradiation and SR-XPS measurements. After irradiation of SSOMB on the Ni(111) surface to some extent, the evolution of the surface oxides were observed by core level photoemission spectra of Ni3p and O1s (SR energy; 680 eV) so that oxygen uptake curves were measured at every translational energy of O beam. The initial sticking rate increased as translational energy increased from 0.06 eV to 1.0 eV, slightly decreased up to 2.2 eV, and a remarkable re-increase was observed in the region around 2.3 eV. These results imply that high speed O molecules adsorb via a new potential barrier.
Inoue, Keisuke*; Teraoka, Yuden
no journal, ,
no abstracts in English
Inoue, Keisuke*; Teraoka, Yuden
no journal, ,
Jinno, Muneaki*; Inoue, Keisuke*; Teraoka, Yuden
no journal, ,
Teraoka, Yuden; Inoue, Keisuke*
no journal, ,
no abstracts in English
Sano, Keisuke*; Ono, Naoko*; Ukai, Shigeharu*; Hayashi, Shigenari*; Miura, Seiji*; Yamashita, Shinichiro; Inoue, Toshihiko
no journal, ,
no abstracts in English