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Journal Articles

Anomalous lattice deformation in GaN/SiC(0001) measured by high-speed ${{it in situ}}$ synchrotron X-ray diffraction

Sasaki, Takuo; Ishikawa, Fumitaro*; Takahashi, Masamitsu

Applied Physics Letters, 108(1), p.012102_1 - 012102_5, 2016/01


 Times Cited Count:1 Percentile:6.36(Physics, Applied)

Oral presentation

Observation of strain relaxation in MBE-grown nitride semiconductors by in situ synchrotron X-ray diffraction

Sasaki, Takuo; Deki, Ryota; Ishikawa, Fumitaro*; Yamaguchi, Tomohiro*; Takahashi, Masamitsu

no journal, , 

no abstracts in English

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