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Teraoka, Yuden; Jinno, Muneaki*; Takaoka, Tsuyoshi*; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
Denki Gakkai Rombunshi, C, 134(4), p.524 - 525, 2014/04
Teraoka, Yuden; Iwai, Yutaro*; Yoshigoe, Akitaka; Okada, Ryuta
Dai-57-Kai Nihon Gakujutsu Kaigi Zairyo Kogaku Rengo Koenkai Koen Rombunshu, p.44 - 45, 2013/11
no abstracts in English
Teraoka, Yuden; Inoue, Keisuke*; Jinno, Muneaki*; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Takaoka, Tsuyoshi*; Yoshigoe, Akitaka; Komeda, Tadahiro*
Dai-56-Kai Nihon Gakujutsu Kaigi Zairyo Kogaku Rengo Koenkai Koen Rombunshu, p.360 - 361, 2012/10
no abstracts in English
Yoshigoe, Akitaka; Okada, Ryuta; Teraoka, Yuden; Iwai, Yutaro*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
Ge is much attracting as a new material in future electronic devices and therfore oxidation of Ge crystal surfaces is now important. In this conference, we report that evolution of oxides on Ge(100)-21 surface up to saturated oxidation for thermal-O
and supersonic O
(2.2 eV) beams was studied by time-resolved observation using synchrotron radiation XPS. We found that Ge
/Ge
is almost constant from early stages of oxidation to saturation.
Yoshigoe, Akitaka; Okada, Ryuta; Teraoka, Yuden; Iwai, Yutaro*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
Ge and its oxidation are attracting widespread interest in the field of development of future electronic devices. In this conference, we report incident energy dependence of initial sticking probability for a Ge(100)-21 surface at room temperature. We obtained results which suggest two energy barriers for O
adsorption at around 0.1eV and 0.47 eV.
Teraoka, Yuden; Jinno, Muneaki*; Takaoka, Tsuyoshi*; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
no journal, ,
Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Iwai, Yutaro*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
We have studied oxidation of the Ge(111)-c(28) surface which is a candidate for a new channel material of n-type metal-oxide-semiconductor field-effect transistors because of its high electron mobility. In our previous work, we found that Ge
oxidation state (n:1-3) is formed by supersonic O
beam of translational energy (E
) of 2.3 eV, while oxidation states up to 2+ are observed in the case of thermal-O
. Such difference depending on E
has not been reported in our knowledge. In this study, we investigate threshold energy for Ge
generation using photoelectron spectroscopy with synchrotron radiation at BL23SU in SPring-8. We found that Ge
component clearly appear over 1.0 eV region. This result implies that activated dissociative adsorption with threshold energy of 1.0 eV takes place.
Teraoka, Yuden; Iwai, Yutaro*; Okada, Ryuta; Yoshigoe, Akitaka
no journal, ,
Teraoka, Yuden; Yoshigoe, Akitaka; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Nishimura, Tetsuya; Baba, Yuji; Okada, Ryuta; Iwai, Yutaro*
no journal, ,
no abstracts in English
Iwai, Yutaro*; Teraoka, Yuden; Okada, Ryuta; Yoshigoe, Akitaka
no journal, ,
Teraoka, Yuden; Iwai, Yutaro*; Okada, Ryuta; Yoshigoe, Akitaka
no journal, ,
no abstracts in English
Yoshigoe, Akitaka; Okada, Ryuta; Iwai, Yutaro*; Teraoka, Yuden; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
Ge has been important because it is candidate for a substitute channel material for future electronic devices. In this talk, we present synchrotron radiation XPS study of the oxidation of clean Ge(100) in ambient condition. The analysis of the oxidation states of surface oxides were conducted using SUREAC2000 at BL23SU of SPring-8. We found the surface oxide up to +4 oxidation stat after oxidation over 10 hours, which is strong contrast to the UHV oxidation reported by us.
Yoshigoe, Akitaka; Okada, Ryuta; Teraoka, Yuden; Iwai, Yutaro*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
There is considerable interest in germanium as a channel material for developing Si devices because of its high carrier mobility. Thus, Ge oxides and its growth mechanism are attracting widespread interest. In this conference, we report on the dependence of adsorption processes in room-temperature oxidation at a Ge(100)-21 surface on translational energy of O
clarified by the measurement of initial sticking probability. All experiments were performed using SUREAC2000 at BL23SU of SPring-8. It was found that adsorption mechanism changes around 0.1 eV. Furthermore, we found out two energy barriers for the adsorption of O
with translational energy of 2.2 eV.
Yoshigoe, Akitaka; Okada, Ryuta; Teraoka, Yuden; Iwai, Yutaro*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
Ge has received much attention as a new channel material for metal-insulator-semiconductor field-effect-transistors due to its high carrier mobility. However, fundamental aspects of oxide growth mechanisms remain still unclear. In this conference, we report evolution of oxides for oxidation of a Ge(100)-21 surface using O
at 300 K. In-situ observation by synchrotron radiation photoelectron spectroscopy was conducted using SUREAC2000 at BL23SU in SPring-8. We found that Ge
/Ge
ratio is almost 0.5 until saturation. This result indicates that dissociative chemisorption takes place at bridge and backbond sites of a Ge-Ge dimer and the number of this oxide increases with O
dose.
Jinno, Muneaki*; Teraoka, Yuden; Takaoka, Tsuyoshi*; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
no journal, ,
no abstracts in English
Jinno, Muneaki*; Teraoka, Yuden; Takaoka, Tsuyoshi*; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
no journal, ,
Takaoka, Tsuyoshi*; Jinno, Muneaki*; Teraoka, Yuden; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
no journal, ,
no abstracts in English
Jinno, Muneaki*; Teraoka, Yuden; Takaoka, Tsuyoshi*; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
no journal, ,
no abstracts in English
Jinno, Muneaki*; Teraoka, Yuden; Harries, J.; Takaoka, Tsuyoshi*; Yoshigoe, Akitaka; Okada, Ryuta; Iwai, Yutaro*; Komeda, Tadahiro*
no journal, ,
no abstracts in English
Jinno, Muneaki*; Teraoka, Yuden; Takaoka, Tsuyoshi*; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
no journal, ,
no abstracts in English