The Observation of a transient surface morphology in the femtosecond laser ablation process by using the soft X-ray laser probe

Hasegawa, Noboru; Nishikino, Masaharu; Tomita, Takuro*; Onishi, Naofumi*; Ito, Atsushi*; Eyama, Tsuyoshi*; Kakimoto, Naoya*; Izutsu, Rui*; Minami, Yasuo*; Baba, Motoyoshi*; et al.

X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.95890A_1 - 95890A_8, 2015/09

https://doi.org/10.1117/12.2186744

We have improved a soft X-ray laser (SXRL) interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot imaging of the nano-scaled structure dynamics of the laser induced materials. By the precise imaging optics and double time fiducial system having been installed, the lateral resolution on the sample surface and the precision of the temporal synchronization between the SXRL and Ti:Sapphire laser pulses were improved to be 700 nm and 2 ps, respectively. By using this system, the initial stage (before 200 ps) of the ablation process of the Pt surface pumped by 80 fs Ti:Sapphire laser pulse was observed by the comparison between the soft X-ray reflective image and interferogram. We have succeeded in the direct observation of the unique ablation process around the ablation threshold such as the rapid increase of the surface roughness and surface vibration.