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Journal Articles

Time-resolved X-ray diffraction measurements of high-density InAs quantum dots on Sb/GaAs layers and the suppression of coalescence by Sb-irradiated growth interruption

Kakuda, Naoki*; Kaizu, Toshiyuki*; Takahashi, Masamitsu; Fujikawa, Seiji; Yamaguchi, Koichi*

Japanese Journal of Applied Physics, 49(9), p.095602_1 - 095602_4, 2010/09

https://doi.org/10.1143/JJAP.49.095602

Times Cited Count：4 Percentile：18.76(Physics, Applied)